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Production Line Tool v5.0
The DA1470x Production Line Tool Software Package
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The PLTD API data structures. More...
Classes | |
| struct | __pltd_dbg_params |
| PLTD debug settings. More... | |
| struct | __pltd_dut_results |
| Holds the DUTs, GU and instrument callback status codes. Used at __pltd_general_params::user_callback_pltd function return parameter. More... | |
| struct | __pltd_versions |
| Holds the versions of the various firmwares and DLLs used in the Production Line Tool. More... | |
| struct | __clbk_data_array |
| Holds all the data retrieved from callback for each DUT. More... | |
| struct | __pltd_dev_params |
| PLTD library parameters for each different device. More... | |
| struct | __plt_log_info |
| PLTD library parameters for each different device. More... | |
| struct | __pltd_ble_tester |
| BLE tester instrument specific settings. More... | |
| struct | __pltd_ble_test_tx_pwr |
| BLE tester measurement settings for TX power measurements common to all DUTs. More... | |
| struct | __pltd_ble_test_freq_offs |
| BLE tester measurement settings for TX frequency offset measurements common to all DUTs. More... | |
| struct | __pltd_ble_test_mod_idx |
| BLE tester measurement settings for the TX modulation index measurements common to all DUTs. More... | |
| struct | __pltd_ble_test_rx_sens |
| BLE tester measurement settings for the RX sensitivity measurements common to all DUTs. More... | |
| struct | __pltd_temp_meas |
| Temperature measurement settings. More... | |
| struct | __pltd_ammeter |
| Ammeter instrument general settings. More... | |
| struct | __pltd_ammeter_params |
| Ammeter test settings and limits for testing current. More... | |
| struct | __pltd_gpio_led_test |
| GPIO/LED test settings. More... | |
| struct | __pltd_gpio_connection_test |
| GPIO connection test settings. Sets the level of a GPIO and gets the level on another GPIO. More... | |
| struct | __pltd_gpio_watchdog |
| GPIO watchdog period toggle settings. Continuously toggles a DUT GPIO (not during test firmware download). More... | |
| struct | __pltd_custom_test |
| Custom test settings. More... | |
| struct | __pltd_adc_vbat_test |
| ADC VBAT measurement settings. More... | |
| struct | __pltd_timestamp_rd |
| Timestamp read settings. More... | |
| struct | __pltd_periph_test |
| Peripheral test (LEDs, buzzer, etc.) using current measurements. More... | |
| struct | __pltd_ext32Khz_test |
| External 32KHz test settings. More... | |
| struct | __pltd_xtal_trim |
| XTAL trim calibration test settings. More... | |
| struct | __pltd_ble_scan |
| PLTD BLE scan configuration parameters. More... | |
| struct | __pltd_ble_hci_scan |
| PLTD Configuration parameters of the BLE scan DUT HCI advertisements during production tests. More... | |
| struct | __pltd_rssi_test |
| RF RSSI test parameters, performed using the Golden Unit. More... | |
| struct | __pltd_uart_test |
| UART loopback test parameters used in DUT to PC UART connection test. More... | |
| struct | __pltd_test_params |
| PLTD library production test parameters for all devices under test. More... | |
| struct | __pltd_mem_params |
| PLTD library memory parameters for all devices under test. More... | |
| struct | __pltd_ic_params |
| PLTD IC specific general parameters for all devices under test. More... | |
| union | __pltd_params |
| PLTD library union containing parameters for all devices under test. More... | |
| struct | __pltd_general_params |
| PLTD library general parameters for all devices under test. More... | |
Typedefs | |
| typedef struct __pltd_dbg_params | _pltd_dbg_params |
| PLTD debug settings. | |
| typedef struct __pltd_dut_results | _pltd_dut_results |
| Holds the DUTs, GU and instrument callback status codes. Used at __pltd_general_params::user_callback_pltd function return parameter. | |
| typedef struct __pltd_versions | _pltd_versions |
| Holds the versions of the various firmwares and DLLs used in the Production Line Tool. | |
| typedef struct __clbk_data_array | _clbk_data_array |
| Holds all the data retrieved from callback for each DUT. | |
| typedef void(_stdcall * | _user_callback_pltd) (_pltd_dut_results *pltd_dut_results_t) |
| PLTD API callback function type definition. Used at __pltd_general_params::user_callback_pltd. More... | |
| typedef struct __pltd_dev_params | _pltd_dev_params |
| PLTD library parameters for each different device. | |
| typedef struct __plt_log_info | _plt_log_info |
| PLTD library parameters for each different device. | |
| typedef struct __pltd_ble_tester | _pltd_ble_tester |
| BLE tester instrument specific settings. | |
| typedef struct __pltd_ble_test_tx_pwr | _pltd_ble_test_tx_pwr |
| BLE tester measurement settings for TX power measurements common to all DUTs. | |
| typedef struct __pltd_ble_test_freq_offs | _pltd_ble_test_freq_offs |
| BLE tester measurement settings for TX frequency offset measurements common to all DUTs. | |
| typedef struct __pltd_ble_test_mod_idx | _pltd_ble_test_mod_idx |
| BLE tester measurement settings for the TX modulation index measurements common to all DUTs. | |
| typedef struct __pltd_ble_test_rx_sens | _pltd_ble_test_rx_sens |
| BLE tester measurement settings for the RX sensitivity measurements common to all DUTs. | |
| typedef struct __pltd_temp_meas | _pltd_temp_meas |
| Temperature measurement settings. | |
| typedef struct __pltd_ammeter | _pltd_ammeter |
| Ammeter instrument general settings. | |
| typedef struct __pltd_ammeter_params | _pltd_ammeter_params |
| Ammeter test settings and limits for testing current. | |
| typedef struct __pltd_gpio_led_test | _pltd_gpio_led_test |
| GPIO/LED test settings. | |
| typedef struct __pltd_gpio_connection_test | _pltd_gpio_connection_test |
| GPIO connection test settings. Sets the level of a GPIO and gets the level on another GPIO. | |
| typedef struct __pltd_gpio_watchdog | _pltd_gpio_watchdog |
| GPIO watchdog period toggle settings. Continuously toggles a DUT GPIO (not during test firmware download). | |
| typedef struct __pltd_custom_test | _pltd_custom_test |
| Custom test settings. | |
| typedef struct __pltd_adc_vbat_test | _pltd_adc_vbat_test |
| ADC VBAT measurement settings. | |
| typedef struct __pltd_timestamp_rd | _pltd_timestamp_rd |
| Timestamp read settings. | |
| typedef struct __pltd_periph_test | _pltd_periph_test |
| Peripheral test (LEDs, buzzer, etc.) using current measurements. | |
| typedef struct __pltd_ext32Khz_test | _pltd_ext32Khz_test |
| External 32KHz test settings. | |
| typedef struct __pltd_xtal_trim | _pltd_xtal_trim |
| XTAL trim calibration test settings. | |
| typedef struct __pltd_ble_scan | _pltd_ble_scan |
| PLTD BLE scan configuration parameters. | |
| typedef struct __pltd_ble_hci_scan | _pltd_ble_hci_scan |
| PLTD Configuration parameters of the BLE scan DUT HCI advertisements during production tests. | |
| typedef struct __pltd_rssi_test | _pltd_rssi_test |
| RF RSSI test parameters, performed using the Golden Unit. | |
| typedef struct __pltd_uart_test | _pltd_uart_test |
| UART loopback test parameters used in DUT to PC UART connection test. | |
| typedef struct __pltd_test_params | _pltd_test_params |
| PLTD library production test parameters for all devices under test. | |
| typedef struct __pltd_mem_params | _pltd_mem_params |
| PLTD library memory parameters for all devices under test. | |
| typedef struct __pltd_ic_params | _pltd_ic_params |
| PLTD IC specific general parameters for all devices under test. | |
| typedef union __pltd_params | _pltd_params |
| PLTD library union containing parameters for all devices under test. | |
| typedef struct __pltd_general_params | _pltd_general_params |
| PLTD library general parameters for all devices under test. | |
The PLTD API data structures.
| typedef void(_stdcall * _user_callback_pltd) (_pltd_dut_results *pltd_dut_results_t) |
PLTD API callback function type definition. Used at __pltd_general_params::user_callback_pltd.
Definition at line 655 of file prod_line_tool_dll.h.