PLTD library production test parameters for all devices under test. More...

#include <prod_line_tool_dll.h>

Public Attributes
_pltd_adc_vbat_test	adc_vbat_test

_pltd_timestamp_rd	timestamp_rd

_pltd_gpio_watchdog	gpio_wd

_pltd_xtal_trim	xtal_trim

_pltd_ble_hci_scan	ble_scan_hci

_pltd_rssi_test	rssi_test [MAX_SUPPORTED_RF_TESTS]

_pltd_ble_tester	ble_tester

_pltd_ble_test_tx_pwr	ble_test_tx_pwr [MAX_SUPPORTED_BLE_TESTS]

_pltd_ble_test_freq_offs	ble_test_freq_offs [MAX_SUPPORTED_BLE_TESTS]

_pltd_ble_test_mod_idx	ble_test_mod_idx [MAX_SUPPORTED_BLE_TESTS]

_pltd_ble_test_rx_sens	ble_test_rx_sens [MAX_SUPPORTED_BLE_TESTS]

_pltd_gpio_led_test	gpio_led_test [MAX_SUPPORTED_GPIO_TESTS]

_pltd_gpio_connection_test	gpio_conn_test [MAX_SUPPORTED_GPIO_CONN_TESTS]

_pdll_sensor_test	sensor [MAX_SUPPORTED_SENS_TESTS]

_pltd_custom_test	custom_test [MAX_SUPPORTED_CUSTOM_TESTS]

_pltd_ext32Khz_test	ext32Khz_test

_pltd_ammeter	ammeter

_pltd_ammeter_params	ammeter_sleep

_pltd_periph_test	periph_test [MAX_SUPPORTED_PERIPH_TESTS]

_pltd_temp_meas	temp_meas

_pltd_ble_scan	ble_scan

Detailed Description

PLTD library production test parameters for all devices under test.

Definition at line 904 of file prod_line_tool_dll.h.

Member Data Documentation

◆ adc_vbat_test

_pltd_adc_vbat_test __pltd_test_params::adc_vbat_test

ADC VBAT measure test parameters.

Definition at line 906 of file prod_line_tool_dll.h.

◆ ammeter

_pltd_ammeter __pltd_test_params::ammeter

Ammeter instrument general settings as given at __pltd_ammeter.

Definition at line 922 of file prod_line_tool_dll.h.

◆ ammeter_sleep

_pltd_ammeter_params __pltd_test_params::ammeter_sleep

Sleep current measurement settings and limits as given at __pltd_ammeter_params.

Definition at line 923 of file prod_line_tool_dll.h.

◆ ble_scan

_pltd_ble_scan __pltd_test_params::ble_scan

BLE scan parameters as given in __pltd_ble_scan.

Definition at line 926 of file prod_line_tool_dll.h.

◆ ble_scan_hci

_pltd_ble_hci_scan __pltd_test_params::ble_scan_hci

BLE HCI scan parameters as given in __pltd_ble_hci_scan.

Definition at line 910 of file prod_line_tool_dll.h.

◆ ble_test_freq_offs

_pltd_ble_test_freq_offs __pltd_test_params::ble_test_freq_offs[MAX_SUPPORTED_BLE_TESTS]

BLE tester measurement settings for TX frequency offset measurements common to all DUTs, set at __pltd_ble_test_freq_offs.

Definition at line 914 of file prod_line_tool_dll.h.

◆ ble_test_mod_idx

_pltd_ble_test_mod_idx __pltd_test_params::ble_test_mod_idx[MAX_SUPPORTED_BLE_TESTS]

BLE tester measurement settings for the TX modulation index measurements common to all DUTs, set at __pltd_ble_test_mod_idx.

Definition at line 915 of file prod_line_tool_dll.h.

◆ ble_test_rx_sens

_pltd_ble_test_rx_sens __pltd_test_params::ble_test_rx_sens[MAX_SUPPORTED_BLE_TESTS]

BLE tester measurement settings for the RX sensitivity measurements common to all DUTs, set at __pltd_ble_test_rx_sens.

Definition at line 916 of file prod_line_tool_dll.h.

◆ ble_test_tx_pwr

_pltd_ble_test_tx_pwr __pltd_test_params::ble_test_tx_pwr[MAX_SUPPORTED_BLE_TESTS]

BLE tester measurement settings for TX power measurements common to all DUTs, set at __pltd_ble_test_tx_pwr.

Definition at line 913 of file prod_line_tool_dll.h.

◆ ble_tester

_pltd_ble_tester __pltd_test_params::ble_tester

BLE tester instrument specific settings, set at __pltd_ble_tester.

Definition at line 912 of file prod_line_tool_dll.h.

◆ custom_test

_pltd_custom_test __pltd_test_params::custom_test[MAX_SUPPORTED_CUSTOM_TESTS]

Custom test parameters as given in __pltd_custom_test.

Definition at line 920 of file prod_line_tool_dll.h.

◆ ext32Khz_test

_pltd_ext32Khz_test __pltd_test_params::ext32Khz_test

External 32KHz test parameters as given in __pltd_ext32Khz_test.

Definition at line 921 of file prod_line_tool_dll.h.

◆ gpio_conn_test

_pltd_gpio_connection_test __pltd_test_params::gpio_conn_test[MAX_SUPPORTED_GPIO_CONN_TESTS]

Parameters for the GPIO connection tests as given in __pltd_gpio_connection_test.

Definition at line 918 of file prod_line_tool_dll.h.

◆ gpio_led_test

_pltd_gpio_led_test __pltd_test_params::gpio_led_test[MAX_SUPPORTED_GPIO_TESTS]

Parameters for the GPIO/LED test as given in __pltd_gpio_led_test.

Definition at line 917 of file prod_line_tool_dll.h.

◆ gpio_wd

_pltd_gpio_watchdog __pltd_test_params::gpio_wd

Parameters for the GPIO connection tests as given in __pltd_gpio_watchdog.

Definition at line 908 of file prod_line_tool_dll.h.

◆ periph_test

_pltd_periph_test __pltd_test_params::periph_test[MAX_SUPPORTED_PERIPH_TESTS]

Peripheral tests (LEDs, Buzzers, etc.) using ammeter.

Definition at line 924 of file prod_line_tool_dll.h.

◆ rssi_test

_pltd_rssi_test __pltd_test_params::rssi_test[MAX_SUPPORTED_RF_TESTS]

RF RSSI test parameters as given in __pltd_rssi_test, performed using the Golden Unit.

Definition at line 911 of file prod_line_tool_dll.h.

◆ sensor

_pdll_sensor_test __pltd_test_params::sensor[MAX_SUPPORTED_SENS_TESTS]

Sensor test parameters as used in __pdll_sensor_test.

Definition at line 919 of file prod_line_tool_dll.h.

◆ temp_meas

_pltd_temp_meas __pltd_test_params::temp_meas

The temperature measurement parameters as given in __pltd_temp_meas.

Definition at line 925 of file prod_line_tool_dll.h.

◆ timestamp_rd

_pltd_timestamp_rd __pltd_test_params::timestamp_rd

IC timestamp read parameters.

Definition at line 907 of file prod_line_tool_dll.h.

◆ xtal_trim

_pltd_xtal_trim __pltd_test_params::xtal_trim

XTAL trim calibration parameters as given in __pltd_xtal_trim.

Definition at line 909 of file prod_line_tool_dll.h.

The documentation for this struct was generated from the following file:

C:/WORK/PLT/PLT_I/COBALT/CODE/prod_tool_ref/prod_tools/production_line_tool/core_dlls/prod_line_tool_dll/prod_line_tool_dll.h

Public Attributes