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Production Line Tool v5.0
The DA1470x Production Line Tool Software Package
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| C__clbk_data_array | Holds all the data retrieved from callback for each DUT |
| C__dbg_params | The main settings of the Debug DLL API |
| C__gu_scan_data | Holds the GU scan data |
| C__ic_gpio | GPIO selection based on IC |
| C__pdll_adc_vbat_en | P_dll library parameters for enabling the VBAT measurement using the internal ADC |
| C__pdll_audio_test | P_dll library parameters for the audio test |
| C__pdll_audio_tone | P_dll library parameters for audio tone generation. Mainly used at the Golden Unit |
| C__pdll_ble_adv_start_test | P_dll library parameters for starting BLE advertisements through an HCI command send to the DUT |
| C__pdll_ble_adv_stop_test | P_dll library parameters for stopping BLE advertisements through an HCI command send to the DUT |
| C__pdll_custom_test | P_dll library parameters for the custom test/ |
| C__pdll_device | P_dll library parameters for each different device |
| C__pdll_ext32Khz_test | P_dll library parameters for testing the external 32Khz low power crystal |
| C__pdll_fw_versions | Holds the prod_test_XXX.bin and p_dll library versions |
| C__pdll_gpio_get | P_dll library parameters for GPIO get status test |
| C__pdll_gpio_set | P_dll library parameters for GPIO set operation |
| C__pdll_gpio_toggle | P_dll library parameters for GPIO toggle operation |
| C__pdll_gpio_watchdog | P_dll library parameters for GPIO watchdog operation |
| C__pdll_rdtester | P_dll library parameters for the rd tester commands. Commands send from the Golden Unit to the CPLD |
| C__pdll_rdtester_init | P_dll library parameters for the rd tester init command |
| C__pdll_rdtester_rst | P_dll library parameters for the rdtester_vbat_uart_rst_ctrl command |
| C__pdll_rdtester_vbat_uart_rst | P_dll library parameters for the rdtester_vbat_uart_rst_ctrl command |
| C__pdll_rf_test | P_dll library parameters for the RF test |
| C__pdll_scan_test | P_dll library parameters for the scan test |
| C__pdll_sensor_test | P_dll library parameters for the sensor test |
| C__pdll_set_tx_pwr | P_dll library parameters for setting the TX power level in RF test mode |
| C__pdll_sleep_test | P_dll library parameters for setting the devices into the various sleep mode |
| C__pdll_test_data | P_dll library parameters for the device test data |
| C__pdll_uart_loop_test | P_dll library parameters for UART loop test |
| C__pdll_xtal_test | P_dll library parameters for the XTAL trim test |
| C__plt_log_info | PLTD library parameters for each different device |
| C__pltd_adc_vbat_test | ADC VBAT measurement settings |
| C__pltd_ammeter | Ammeter instrument general settings |
| C__pltd_ammeter_params | Ammeter test settings and limits for testing current |
| C__pltd_ble_hci_scan | PLTD Configuration parameters of the BLE scan DUT HCI advertisements during production tests |
| C__pltd_ble_scan | PLTD BLE scan configuration parameters |
| C__pltd_ble_test_freq_offs | BLE tester measurement settings for TX frequency offset measurements common to all DUTs |
| C__pltd_ble_test_mod_idx | BLE tester measurement settings for the TX modulation index measurements common to all DUTs |
| C__pltd_ble_test_rx_sens | BLE tester measurement settings for the RX sensitivity measurements common to all DUTs |
| C__pltd_ble_test_tx_pwr | BLE tester measurement settings for TX power measurements common to all DUTs |
| C__pltd_ble_tester | BLE tester instrument specific settings |
| C__pltd_custom_test | Custom test settings |
| C__pltd_dbg_params | PLTD debug settings |
| C__pltd_dev_params | PLTD library parameters for each different device |
| C__pltd_dut_results | Holds the DUTs, GU and instrument callback status codes. Used at __pltd_general_params::user_callback_pltd function return parameter |
| C__pltd_ext32Khz_test | External 32KHz test settings |
| C__pltd_general_params | PLTD library general parameters for all devices under test |
| C__pltd_gpio_connection_test | GPIO connection test settings. Sets the level of a GPIO and gets the level on another GPIO |
| C__pltd_gpio_led_test | GPIO/LED test settings |
| C__pltd_gpio_watchdog | GPIO watchdog period toggle settings. Continuously toggles a DUT GPIO (not during test firmware download) |
| C__pltd_ic_params | PLTD IC specific general parameters for all devices under test |
| C__pltd_mem_params | PLTD library memory parameters for all devices under test |
| C__pltd_params | PLTD library union containing parameters for all devices under test |
| C__pltd_periph_test | Peripheral test (LEDs, buzzer, etc.) using current measurements |
| C__pltd_rssi_test | RF RSSI test parameters, performed using the Golden Unit |
| C__pltd_temp_meas | Temperature measurement settings |
| C__pltd_test_params | PLTD library production test parameters for all devices under test |
| C__pltd_timestamp_rd | Timestamp read settings |
| C__pltd_uart_test | UART loopback test parameters used in DUT to PC UART connection test |
| C__pltd_versions | Holds the versions of the various firmwares and DLLs used in the Production Line Tool |
| C__pltd_xtal_trim | XTAL trim calibration test settings |
| C__rx_stats | Holds the production test results for each device |
| C__udll_cs_booter | U_dll library Booter properties for the Configuration Script data holding structure |
| C__udll_cs_dev_booter | U_dll library Configuration Script device specific booter command |
| C__udll_cs_min_fw_ver | U_dll library Configuration Script minimum firmware version |
| C__udll_cs_reg_entry | U_dll library Configuration Script register entries |
| C__udll_cs_sdk_entry | U_dll library SDK Value data holding structure. 0xE9RRYYXX E9: indicates that the following word(s) are not to be stored to registers but will be used by the SDK SW RR: is an index (Set ID) and can be used for different sets of parameters by the SW application. One Set ID comprises 256 Group IDs. RR = 0xFF is reserved for customer use only. RR = 0x00 will be used for Dialog parameters. RR = 0x01 – 0xEF are reserved for future use of Dialog parameters. YY: indicates that 0xYY amount of words follow. XX: is an index (Group ID) and can be used for different parameters by the SW application |
| C__udll_cs_sw_gen_sdk | U_dll library SW Generated SDK Value data holding structure |
| C__udll_cs_uart_stx | U_dll library Configuration Script UART STX timeout data |
| C__udll_cs_xtal_settle | U_dll library Configuration Script XTAL settle trim data |
| C__udll_dev_params | U_dll library parameters for each different device |
| C__udll_flash_er | U_dll library flash erase programming parameters |
| C__udll_flash_init | U_dll library flash initialization parameters |
| C__udll_flash_wr | U_dll library flash image programming parameters |
| C__udll_fw_load | U_dll library firmware load parameters |
| C__udll_fw_ver | U_dll library firmware version parameters |
| C__udll_fw_versions | Holds the versions of the firmware used during device testing |
| C__udll_gpio_watchdog | U_dll library parameters for GPIO watchdog operation |
| C__udll_ic_params | U_dll library programming parameters |
| C__udll_mem_params | U_dll memory action parameters |
| C__udll_mem_rd | U_dll library Memory read parameters |
| C__udll_mem_wr | U_dll library Structure for custom memory data programming |
| C__udll_otp_cs_wr | U_dll library Configuration Script write parameters |
| C__udll_otp_wr | U_dll library OTP image programming parameters |
| C__udll_params | U_dll library programming parameters union |
| C__udll_ram_fw | U_dll library RAM firmware download parameters |