Intersil radiation hardened (rad hard) analog ICs are designed to optimize performance, reduce system SWaP (size, weight and power) costs and speed time to market for space and harsh environment applications.

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Manufacturing & Test Information

Renesas' rad hard analog portfolio strives for best-in-class performance, reduced system SWAP costs and fast time to market. Renesas has an unparalleled track record of providing highly reliable, efficient and accurate radiation hardened products that fit a wide range of space applications, including satellite communications and space flight systems.

The low dose rate ionizing dose response of semiconductors has become a key issue in space applications. Renesas is addressing this market by wafer-by-wafer low dose rate acceptance testing as a complement to current high dose rate acceptance testing.

Renesas is one of only a few RHA Defense Logistics Agency (Land and Maritime) QML suppliers. All of Renesas' radiation hardened SMD products are MIL-PRF-38535/QML compliant and are 100% burned in.


Rad Hard Buffers

High-speed closed-loop buffer with user-programmable gain and output limiting

Rad Hard CAN Bus Transceivers

Low dose rate tested CAN transceivers that reduce system level bit error rates

Rad Hard Comparators

Comparators that provide immunity to single event latch-up in the space environment

Rad Hard Current Sense Amplifiers

Radiation hardened, high side current sense amplifiers for the space environment

Rad Hard Current Sources

ICs that provide current excitation to resistive sensors in satellite subsystems

Rad Hard Instrumentation Amplifiers

High-performance, differential and single-ended output instrumentation amplifiers

Rad Hard Interface

Quad differential line drivers for digital data transmission in RS-422 applications

Rad Hard Multiplexers

Radiation hardened MUXes provide ESD protection for data acquisition systems

Rad Hard Op Amps

Low noise, low offset voltage, low input bias current, and low temperature drift op amps

Rad Hard Sample and Hold

Rad hard monolithic circuit consisting of a high-performance operational amplifier

Rad Hard Switches

Rad hard analog switches are monolithic devices that ensure latch-up free operation

Rad Hard Temperature Sensors

Rad hard 2-terminal temperature transducers with high impedance current output

Rad Hard Transistor Arrays

Rad hard bipolar transistor arrays offer high gain-bandwidth and a low noise figure

Rad Hard Voltage References

Ultra-low noise devices ideal for applications where low noise performance is critical
Are Your ICs Ready for the Real Space Environment?

Over the past 19 years, the space industry has placed a higher value on understanding the effects that long-term, low dose radiation can have on ICs. Intersil's radiation testing specialist Nick van Vonno discusses why this shift has occurred and what we are doing to address this change.


There are many different types of radiation, and indeed Intersil addresses two of these. Intersil addresses total dose testing which is basically gamma rays. Okay, and at both high and low dose rate, as we'll get into later. Intersil also addresses single event effects of a fairly broad range, and those are typically addressed by heavy ion testing.

Low dose rate testing, you have to contrast this really in order to understand this. You have to look historically at how total dose testing which is done with gamma rays, how that's been performed. Historically this has been performed at what we call high dose rate, and typically to put this in some numbers, that would run somewhere in the range of 50rad to 300rad/s.

Low dose rate, on the other hand, is a much, much slower dose rate. The generally accepted number, and the one we perform our work in, is 0.01rad/s. You see how far that's away from 300rad a second. And that can also be expressed as 10mrad/s if you'd like.

Now why are we goofing with that? And the answer is that the low dose rate is what happens in space. Dose rates in space are almost uniformly low to the order of 10mrad/s. Low dose rate radiation testing has been a, let's call it a hot topic in silicon advanced research since about 1992, okay? In 1992, some researchers out at Mich research came up with a very unusual finding which showed that certain parts that looked very good at high dose rate degrade with amazing rapidity, orders and orders of magnitude, worse at low dose rate. And so, that was not a fully intuitive result, and indeed it had to be repeated, and in the intervening 19 years there is a very large amount of work that's been done on low dose rate effects. And, as we've learned about how different parts react in low dose rate, we've, as an industry, we've swung over more towards a low dose rate testing emphasis rather than a high dose rate testing emphasis.