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Radiation Hardened, Dual, Inverting Power MOSFET Driver

封装信息

Lead Count (#) 16
Pkg. Type CFP
Pkg. Code KBT
Pitch (mm) 1.27
Pkg. Dimensions (mm) 10.41 x 6.86 x 0.00

环境和出口类别

Moisture Sensitivity Level (MSL) Not Applicable
Pb (Lead) Free Exempt
ECCN (US) 9A515
HTS (US)

产品属性

Pkg. Type CFP
Lead Count (#) 16
Carrier Type Tray
Moisture Sensitivity Level (MSL) Not Applicable
Qualification Level Class Q
DLA SMD 5962F9951102QXC
Pb (Lead) Free Exempt
Pb Free Category Gold Plate over compliant Undercoat-e4
MOQ 25
Temp. Range -55 to +125°C
CAGE code 34371
DSEE (MeV·cm2/mg) 60
Die Sale Availability? No
Driver Type Low Side
Drivers (#) 2
FET Type MOSFET
Fall Time 75
Flow RH Hermetic
Input VCC (Max) (V) 18
Input VCC (Min) (V) 12
Length (mm) 10.4
Low Side Fall Time (max) (ns) 95
Low Side Rise Time (max) (ns) 95
Output Type Inverting
PROTO Availability? Yes
Peak Output Current IPK (A) 2
Peak Output Sink Current (A) 2
Peak Output Source Current (A) 2
Pitch (mm) 1.3
Pkg. Dimensions (mm) 10.4 x 6.9 x 0.00
Rating Space
Rise Time (Max) 75
SMD URL
TID HDR (krad(Si)) 300
Thickness (mm) 0
Width (mm) 6.9

描述

The Radiation Hardened HS-4423RH, HS-4423EH, HS-4423BRH, HS-4423BEH are inverting, dual, monolithic high-speed MOSFET drivers designed to convert TTL level signals into high current outputs at voltages up to 18V. The inputs of these devices are TTL compatible and can be directly driven by our HS-1825ARH PWM device or by our ACS/ACTS and HCS/HCTS type logic devices. The fast rise times and high current outputs allow very quick control of high gate capacitance power MOSFETs in high-frequency applications. The high current outputs minimize power losses in MOSFETs by rapidly charging and discharging the gate capacitance. The output stage incorporates a low voltage lock-out circuit that puts the outputs into a three-state mode when the supply voltage drops below 10V for the HS-4423RH, HS-4423EH and 7.5V for the HS-4423BRH and HS-4423BEH. Constructed with the Intersil dielectrically isolated Rad Hard Silicon Gate (RSG) BiCMOS process, these devices are immune to Single Event Latch-up and have been specifically designed to provide highly reliable performance in harsh radiation environments.