Pkg. Type | DIE |
Pb (Lead) Free | No |
RoHS (IS0-2100ARH-Q) | 英语日文 |
Moisture Sensitivity Level (MSL) | |
ECCN (US) | |
HTS (US) |
Pkg. Type | DIE |
Qualification Level | Class V |
DLA SMD | 5962F9953602V9A |
Pb (Lead) Free | No |
MOQ | 100 |
Temp. Range | -55 to +125°C |
CAGE code | 34371 |
Bus Voltage (Max) (V) | 130 |
DSEE (MeV·cm2/mg) | 90 |
Die Sale Availability? | Yes |
Driver Type | Half Bridge |
Drivers (#) | 1 |
FET Type | MOSFET |
Fall Time | 60 |
Flow | RH Hermetic |
High Side Fall Time (max) (ns) | 40 |
High Side Rise Time (max) (ns) | 40 |
Input VCC (Max) (V) | 20 |
Input VCC (Min) (V) | 12 |
Lead Compliant | No |
Low Side Fall Time (max) (ns) | 40 |
Low Side Rise Time (max) (ns) | 40 |
Output Type | Synchronous |
PROTO Availability? | Yes |
Peak Output Current IPK (A) | 1.5 |
Peak Output Sink Current (A) | 1.5 |
Peak Output Source Current (A) | 1.5 |
Rating | Space |
Rise Time (Max) | 60 |
SMD URL | |
TID HDR (krad(Si)) | 300 |
Tape & Reel | No |
The radiation hardened IS-2100ARH, IS-2100AEH are high-frequency, 130V half-bridge N-Channel MOSFET driver ICs, which are functionally similar to industry-standard 2110 types. The low-side and high-side gate drivers are independently controlled. This gives the user maximum flexibility in dead time selection and driver protocol. In addition, the devices have on-chip error detection and correction circuitry, which monitors the state of the high-side latch and compares it to the HIN signal. If they disagree, a set or reset pulse is generated to correct the high-side latch. This feature protects the high-side latch from single event upsets (SEUs).