特性
- Gain, DC: 2 x 106 V/V
- Acquisition Time: 1.0µs (0.01%)
- Droop Rate: 0.08µV/µs (+25°C) 17µV/µs (Full Temperature)
- Aperture Time: 25ns
- Hold Step Error (See Glossary): 5mV
- Internal Hold Capacitor
- Fully Differential Input
- TTL Compatible
- Pb-Free Available (RoHS Compliant)
描述
The HA-5320 was designed for use in precision, High-Speed data acquisition systems. The circuit consists of an input transconductance amplifier capable of providing large amounts of charging current, a low leakage analog switch, and an output integrating amplifier. The analog switch sees virtual ground as its load; therefore, charge injection on the hold capacitor is constant over the entire input/output voltage range. The pedestal voltage resulting from this charge injection can be adjusted to zero by use of the offset adjust inputs. The device includes a hold capacitor. However, if improved droop rate is required at the expense of acquisition time, additional hold capacitance may be added externally. This monolithic device is manufactured using the Intersil Dielectric Isolation Process, minimizing stray capacitance and eliminating SCRs. This allows higher speed and latchfree operation. For further information, please see Application Note AN538.
产品参数
| 属性 | 值 |
|---|---|
| Rating | Harsh Environment |
| Max Acquisition Time (10V Step to 0.1%) (μs) | 1.2 |
| Max Acquisition Time (10V Step to 0.01%) (μs) | 1.5 |
| Maximum Drift Current Over Temperature (nA) | 10 |
| Temp. Range (°C) | -55 to +125°C, 0 to +70°C |
| Flow | Harsh Environment & MIL-STD-883 |
| Qualification Level | Standard |
| Die Sale Availability? | No |
| PROTO Availability? | No |
应用
- Precision Data Acquisition Systems
- Digital to Analog Converter Deglitcher
- Auto Zero Circuits
- Peak Detector
| Part Number | Status | Samples | Stock | RoHS | Package | Budgetary Price (USD) | Lead Count (#) | Carrier Type | Moisture Sensitivity Level (MSL) | Pitch (mm) | Pkg. Dimensions (mm) | Pb (Lead) Free | Pb Free Category | MOQ | Temp. Range (°C) | Country of Assembly | Country of Wafer Fabrication |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| HA1-5320-2 | Active | Available | In Stock | Contact | CERDIP | 14# | Tube | Not Applicable | 2.5mm | 19.3 x 7.3 x 0.00 | No | Hot Solder Dip | 250 | -55 to +125°C | |||
| HA9P5320-5Z | Active | N/A | In Stock | RoHS:EN | SOICW | 1u | $34.58 | 16# | Tube | 3 | 1.3mm | 10.3 x 7.5 x 0.20 | Yes | Pb-Free 100% Matte Tin Plate w/Anneal-e3 | 480 | 0 to +70°C | CHINA, MALAYSIA, PHILIPPINES | USA |
| HA9P5320-5ZX96 | Active | N/A | Out of Stock | RoHS:EN | SOICW | 1u | $34.58 | 16# | Reel | 3 | 1.3mm | 10.3 x 7.5 x 0.20 | Yes | Pb-Free 100% Matte Tin Plate w/Anneal-e3 | 1000 | 0 to +70°C | CHINA, MALAYSIA, PHILIPPINES | USA |
- 涨价通告英语PDF 257 KB PIN19006 2019年3月01日
- 产品变更通告英语PDF 98 KB PCN12094 2012年12月19日
- 产品变更通告英语PDF 147 KB PCN11039 2011年4月07日
- 应用说明英语PDF 357 KB an1694 2004年1月19日AI 生成的摘要: The document outlines the four fundamental internal blocks of an operational amplifier and presents a simple 2:1 stage circuit diagram. It includes important legal notices from Renesas Electronics regarding the use, liability, and intellectual property rights of their semiconductor products. The document clarifies product quality grades, intended applications, and restrictions on use in life-critical or hazardous systems. It emphasizes compliance with applicable laws and safety responsibilities when using Renesas products. Contact information for Renesas sales offices worldwide is also provided.
- 应用说明英语PDF 1.06 MB an517 2004年1月19日AI 生成的摘要: Monolithic sample-and-hold amplifiers perform various functions including unity gain buffering, gain scaling, inverting amplification, and filtered sampling. They enable long hold times with short sample intervals by cascading circuits. Applications include glitch removal in D/A converters, signal demultiplexing, automatic offset zeroing, peak detection with comparator reset, and slowing fast waveforms for analysis. These versatile circuits reduce the need for separate modules and improve signal accuracy and stability.
- 应用说明英语PDF 843 KB an535 2002年6月05日AI 生成的摘要: A Data Acquisition System (DAS) requires careful design of signal conditioning, transducer selection, and signal transmission to ensure high accuracy. Signal conditioning includes multiplexing, amplification, filtering, and calibration, ideally performed near the transducer. Transducers convert physical variables to electrical signals, often voltage, with low source resistance preferred. Signal paths can be single-ended or differential; differential paths better reject common mode noise, especially for low-level signals. Shielded twisted pairs and balanced lines reduce interference. Filters, typically Butterworth low-pass, prevent aliasing and maintain signal integrity.
- 应用说明英语PDF 224 KB an9654 1999年5月05日AI 生成的摘要: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
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- 应用说明英语PDF 357 KB an1694 2004年1月19日AI 生成的摘要: The document outlines the four fundamental internal blocks of an operational amplifier and presents a simple 2:1 stage circuit diagram. It includes important legal notices from Renesas Electronics regarding the use, liability, and intellectual property rights of their semiconductor products. The document clarifies product quality grades, intended applications, and restrictions on use in life-critical or hazardous systems. It emphasizes compliance with applicable laws and safety responsibilities when using Renesas products. Contact information for Renesas sales offices worldwide is also provided.
- 应用说明英语PDF 1.06 MB an517 2004年1月19日AI 生成的摘要: Monolithic sample-and-hold amplifiers perform various functions including unity gain buffering, gain scaling, inverting amplification, and filtered sampling. They enable long hold times with short sample intervals by cascading circuits. Applications include glitch removal in D/A converters, signal demultiplexing, automatic offset zeroing, peak detection with comparator reset, and slowing fast waveforms for analysis. These versatile circuits reduce the need for separate modules and improve signal accuracy and stability.
- 应用说明英语PDF 843 KB an535 2002年6月05日AI 生成的摘要: A Data Acquisition System (DAS) requires careful design of signal conditioning, transducer selection, and signal transmission to ensure high accuracy. Signal conditioning includes multiplexing, amplification, filtering, and calibration, ideally performed near the transducer. Transducers convert physical variables to electrical signals, often voltage, with low source resistance preferred. Signal paths can be single-ended or differential; differential paths better reject common mode noise, especially for low-level signals. Shielded twisted pairs and balanced lines reduce interference. Filters, typically Butterworth low-pass, prevent aliasing and maintain signal integrity.
- 应用说明英语PDF 224 KB an9654 1999年5月05日AI 生成的摘要: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
应用说明和白皮书 (4)
- 涨价通告英语PDF 257 KB PIN19006 2019年3月01日
- 产品变更通告英语PDF 98 KB PCN12094 2012年12月19日
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