特性
- Pb-Free Available (RoHS Compliant)
- Analog Voltage Range ±15V
- Analog Current Range 80mA
- Turn-On Time 240ns
- Low rON 55Ω
- Low Power Dissipation 15mW
- TTL/CMOS Compatible
HI-201 Functional Diagram
描述
HI-200/HI-201 (dual/quad) are monolithic devices comprising independently selectable SPST switches which feature fast switching speeds (HI-200 240ns, and HI-201 185ns) combined with low power dissipation (15mW at 25°C). Each switch provides low ON resistance operation for input signal voltage up to the supply rails and for signal current up to 80mA. Rugged DI construction eliminates latch-up and substrate SCR failure modes. All devices provide break-before-make switching and are TTL and CMOS compatible for maximum application versatility. HI-200/HI-201 are ideal components for use in high frequency analog switching. Typical applications include signal path switching, sample and hold circuit, digital filters, and operational amplifier gain switching networks.
产品参数
| 属性 | 值 |
|---|---|
| Rating | Harsh Environment |
| Switches (#) | 4 |
| RON (max) (ohms) | 30 |
| Supply Voltage (min) (V) | -15 - -15 |
| Supply Voltage (max) (V) | 15 - 15 |
| Turn-Off Time (max) (ns) | 1000 |
| Turn-On Time (max) (ns) | 1000 |
| Temp. Range (°C) | -40 to +85°C, -55 to +125°C, 0 to +70°C |
| Flow | Harsh Environment & MIL-STD-883 |
| Qualification Level | Standard |
| Die Sale Availability? | No |
应用
- High Frequency Analog Switching
- Sample and Hold Circuits
- Digital Filters
- Operational Amplifier Gain Switching Networks
| Part Number | Status | Samples | Stock | RoHS | Package | Budgetary Price (USD) | Lead Count (#) | Carrier Type | Moisture Sensitivity Level (MSL) | Pkg. Dimensions (mm) | Pitch (mm) | Pb (Lead) Free | Pb Free Category | MOQ | Temp. Range (°C) | CAGE code | Country of Assembly | Country of Wafer Fabrication |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| HI1-0201-2 | Active | Available | Out of Stock | Contact | CERDIP | 16# | Tube | Not Applicable | 19.3 x 7.3 x 0.00 | 2.5mm | No | Hot Solder Dip | 1000 | -55 to +125°C | 34371 | |||
| HI9P0201-5Z | Active | Available | In Stock | RoHS:EN | SOICN | 1u | $13.12 | 16# | Tube | 3 | 9.9 x 3.9 x 0.00 | 1.3mm | Yes | Pb-Free 100% Matte Tin Plate w/Anneal-e3 | 960 | 0 to +70°C | 34371 | PHILIPPINES, MALAYSIA | USA |
| HI9P0201-5Z96 | Active | Available | In Stock | RoHS:EN | SOICN | 1u | $13.12 | 16# | Reel | 3 | 9.9 x 3.9 x 0.00 | 1.3mm | Yes | Pb-Free 100% Matte Tin Plate w/Anneal-e3 | 2500 | 0 to +70°C | 34371 | PHILIPPINES, MALAYSIA | USA |
| HI9P0201-9Z | Active | Available | In Stock | RoHS:EN | SOICN | 1u | $13.07 | 16# | Tube | 3 | 9.9 x 3.9 x 0.00 | 1.3mm | Yes | Pb-Free 100% Matte Tin Plate w/Anneal-e3 | 960 | -40 to +85°C | 34371 | PHILIPPINES, MALAYSIA | USA |
| HI3-0201-5Z | Obsolete | N/A | In Stock | RoHS:EN | PDIP | 16# | Tube | Not Applicable | 19.0 x 6.6 x 3.94 | 2.5mm | Yes | Pb-Free 100% Matte Tin Plate w/Anneal-e3 | 1000 | 0 to +70°C | 34371 |
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- 涨价通告英语PDF 257 KB PIN19006 2019年3月01日
- 产品变更通告英语PDF 152 KB PCN12085 2012年11月07日
- 产品变更通告英语PDF 86 KB PCN12086 2012年10月24日
- 产品变更通告英语PDF 147 KB PCN11039 2011年4月07日
- 应用说明英语PDF 313 KB an532 2005年7月11日AI 生成的摘要: CMOS analog switches can operate with single or dual power supplies, but single supply operation often increases on resistance and switching times due to lower gate-source bias voltage. The HI-300 series can run on a single +5V supply but with reduced performance. Pin functions vary by device, such as VL, VR, and VREF, which adjust logic threshold levels for TTL or CMOS logic compatibility. Switch functions correspond to a logic HIGH input. Absolute maximum ratings are limits beyond which damage may occur, and on resistance varies due to manufacturing and lot differences, typically within ±10%. Renesas disclaims liability for use outside specified conditions and emphasizes compliance with safety and legal standards.
- 应用说明英语PDF 468 KB an557 2002年5月24日AI 生成的摘要: The document details recommended test procedures for analog switches, focusing on key parameters such as crosstalk, break-before-make delay, and settling time. It explains how to measure crosstalk using decibel ratios and outlines the importance of break-before-make delay to prevent simultaneous switch closure. Settling time is measured to ensure output stability after input changes. It also covers input thresholds, leakage currents, power dissipation, and various switch capacitances, providing test circuit examples and conditions for accurate measurement.
- 应用说明英语PDF 224 KB an9654 1999年5月05日AI 生成的摘要: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
- 应用说明英语PDF 300 KB an1034 1998年11月20日AI 生成的摘要: The document discusses the use of analog switches and multiplexers in wideband applications, highlighting the HI-524 monolithic wideband CMOS multiplexer and the HA-2541 amplifier. It emphasizes the importance of unity gain stability, fast settling time, and output swing for driving coaxial cables. The HI-524 includes feedback resistance to minimize offset voltage. Proper layout is crucial to avoid feedthrough and excessive capacitance. The document also outlines Renesas Electronics' disclaimers on product use, quality grades, safety responsibilities, environmental compliance, and legal restrictions.
- 应用说明英语PDF 270 KB an520 1998年11月20日AI 生成的摘要: Adding a pull-up resistor from CMOS inputs to +5V is essential when interfacing TTL outputs with CMOS inputs to improve interchangeability, noise immunity, compatibility, and reliability. A 2kΩ resistor is generally sufficient. CMOS inputs are compatible with CMOS logic at 5V to 15V without pull-ups. Mechanical switches require pull-up or pull-down resistors to prevent noise and contact issues. Renesas disclaims liability for misuse and emphasizes adherence to product specifications and legal regulations.
- 应用说明英语PDF 201 KB an9402 1994年1月29日
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- 应用说明英语PDF 313 KB an532 2005年7月11日AI 生成的摘要: CMOS analog switches can operate with single or dual power supplies, but single supply operation often increases on resistance and switching times due to lower gate-source bias voltage. The HI-300 series can run on a single +5V supply but with reduced performance. Pin functions vary by device, such as VL, VR, and VREF, which adjust logic threshold levels for TTL or CMOS logic compatibility. Switch functions correspond to a logic HIGH input. Absolute maximum ratings are limits beyond which damage may occur, and on resistance varies due to manufacturing and lot differences, typically within ±10%. Renesas disclaims liability for use outside specified conditions and emphasizes compliance with safety and legal standards.
- 应用说明英语PDF 468 KB an557 2002年5月24日AI 生成的摘要: The document details recommended test procedures for analog switches, focusing on key parameters such as crosstalk, break-before-make delay, and settling time. It explains how to measure crosstalk using decibel ratios and outlines the importance of break-before-make delay to prevent simultaneous switch closure. Settling time is measured to ensure output stability after input changes. It also covers input thresholds, leakage currents, power dissipation, and various switch capacitances, providing test circuit examples and conditions for accurate measurement.
- 应用说明英语PDF 224 KB an9654 1999年5月05日AI 生成的摘要: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
- 应用说明英语PDF 300 KB an1034 1998年11月20日AI 生成的摘要: The document discusses the use of analog switches and multiplexers in wideband applications, highlighting the HI-524 monolithic wideband CMOS multiplexer and the HA-2541 amplifier. It emphasizes the importance of unity gain stability, fast settling time, and output swing for driving coaxial cables. The HI-524 includes feedback resistance to minimize offset voltage. Proper layout is crucial to avoid feedthrough and excessive capacitance. The document also outlines Renesas Electronics' disclaimers on product use, quality grades, safety responsibilities, environmental compliance, and legal restrictions.
- 应用说明英语PDF 270 KB an520 1998年11月20日AI 生成的摘要: Adding a pull-up resistor from CMOS inputs to +5V is essential when interfacing TTL outputs with CMOS inputs to improve interchangeability, noise immunity, compatibility, and reliability. A 2kΩ resistor is generally sufficient. CMOS inputs are compatible with CMOS logic at 5V to 15V without pull-ups. Mechanical switches require pull-up or pull-down resistors to prevent noise and contact issues. Renesas disclaims liability for misuse and emphasizes adherence to product specifications and legal regulations.查看更多 (6)
应用说明和白皮书 (6)
- 涨价通告英语PDF 257 KB PIN19006 2019年3月01日
- 产品变更通告英语PDF 152 KB PCN12085 2012年11月07日
- 产品变更通告英语PDF 86 KB PCN12086 2012年10月24日查看更多 (6)
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