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HI-549

有效

Single 16 and 8, Differential 8-Channel and 4-Channel CMOS Analog MUXs with Active Overvoltage Protection

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特性

  • Analog Overvoltage Protection 70VP-P
  • No Channel Interaction During Overvoltage
  • Guaranteed rON Matching
  • Maximum Power Supply 44V
  • Break-Before-Make Switching
  • Analog Signal Range ±15V
  • Access Time (Typical) 500ns
  • Standby Power (Typical) 7.5mW
  • Pb-Free Plus Anneal Available (RoHS Compliant)
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HI-54x Functional Diagram
HI-54x Functional Diagram

描述

The HI-546, HI-547, HI-548 and HI-549 are analog multiplexers with active overvoltage protection and guaranteed rON matching. Analog input levels may greatly exceed either power supply without damaging the device or disturbing the signal path of other channels. Active protection circuitry assures that signal fidelity is maintained even under fault conditions that would destroy other multiplexers. Analog inputs can withstand constant 70VP-P levels with ±15V supplies. Digital inputs will also sustain continuous faults up to 4V greater than either supply. In addition, signal sources are protected from short circuiting should multiplexer supply loss occur. Each input presents 1kΩ of resistance under this condition. These features make the HI-546, HI-547, HI-548 and HI-549 ideal for use in systems where the analog inputs originate from external equipment or separately powered circuitry. All devices are fabricated with 44V Dielectrically Isolated CMOS technology. The HI-546 is a single 16-Channel, the HI-547 is an 8-Channel differential, the HI-548 is a single 8-Channel and the HI-549 is a 4-Channel differential device. If input overvoltage protection is not needed the HI-506, HI-507, HI-508, HI-509 multiplexers are recommended. For further information see Application Notes AN520 and AN521. For MIL-STD-883 compliant parts, request the HI-546/883, HI-547/883, HI-548/883 and HI-549/883 datasheets.

产品参数

属性值
RatingHarsh Environment
ConfigurationDifferential 4:1
Negative Supply Current (max) (mA)-1
Positive Supply Current (max) (mA)2
Supply Voltage Range (V)±15
Transition Time (max)1µs
Temp. Range (°C)-55 to +125°C
FlowHarsh Environment & MIL-STD-883
Qualification LevelQML Class Q (military)
Die Sale Availability?No
PROTO Availability?No

封装选项

Pkg. TypePkg. Dimensions (mm)Lead Count (#)Pitch (mm)
CERDIP19.3 x 7.3 x 0.00162.5
Part NumberStatusSamplesStockRoHSPackageBudgetary Price (USD)Lead Count (#)Carrier TypeMoisture Sensitivity Level (MSL)Pkg. Dimensions (mm)Pitch (mm)Pb (Lead) FreePb Free CategoryMOQTemp. Range (°C)CAGE codeCountry of AssemblyCountry of Wafer Fabrication
HI1-0549-2ActiveAvailableIn StockContactCERDIP16#TubeNot Applicable19.3 x 7.3 x 0.002.5mmNoHot Solder Dip400-55 to +125°C34371
HI3-0549-5ZObsoleteN/AIn StockContactPDIP16#TubeNot Applicable19.0 x 6.6 x 3.942.5mmYesPb-Free 100% Matte Tin Plate w/Anneal-e32500 to +70°C34371
HI9P0549-9ZLast Time BuyAvailableIn StockRoHS:EN
SOICN1u | $39.1716#Tube39.9 x 3.9 x 0.001.3mmYesPb-Free 100% Matte Tin Plate w/Anneal-e3192-40 to +85°C34371PHILIPPINES, MALAYSIAUSA
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筛选

    推荐文档 (1)

  1. 数据手册
    英语
    HI-546, HI-547, HI-548, HI-549 Datasheet
    RECOMMENDED
    PDF 901 KB hi-546-47-48-49 1999年4月29日

    数据手册 (1)

  1. 数据手册
    英语
    HI-546, HI-547, HI-548, HI-549 Datasheet
    RECOMMENDED
    PDF 901 KB hi-546-47-48-49 1999年4月29日

    应用说明和白皮书 (7)

  1. 应用说明
    英语
    AN557: Recommended Test Procedures for Analog Switches
    PDF 468 KB an557 2002年5月24日
    AI 生成的摘要: The document details recommended test procedures for analog switches, focusing on key parameters such as crosstalk, break-before-make delay, and settling time. It explains how to measure crosstalk using decibel ratios and outlines the importance of break-before-make delay to prevent simultaneous switch closure. Settling time is measured to ensure output stability after input changes. It also covers input thresholds, leakage currents, power dissipation, and various switch capacitances, providing test circuit examples and conditions for accurate measurement.
  2. 应用说明
    英语
    AN9867: End of Life Derating: A Necessity or Overkill
    PDF 338 KB an9867 1999年11月10日
    AI 生成的摘要: Electrical parameters are monitored during life testing to detect drift and failures, defined by exceeding datasheet limits. New products require less than 1% failure during burn-in, with failure analysis and corrective actions if exceeded. Sampling plans ensure defect rates below 3%. Life tests last 1000-3000 hours at 125°C depending on process maturity. Failure mechanisms include electromigration, ionic contamination, hot carrier injection, and dielectric rupture. Product sign-off requires all parties' approval after reliability confirmation. Space products undergo burn-in and quality conformance inspections with strict failure limits. Derating is unnecessary as datasheet limits are set at 6-sigma from characterization data, ensuring reliability.
  3. 应用说明
    英语
    AN9654: Use of Life Tested Parts
    PDF 224 KB an9654 1999年5月05日
    AI 生成的摘要: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
  4. 应用说明
    英语
    AN1034: CMOS Analog Multiplexers and Switches, Applications Considerations
    PDF 300 KB an1034 1998年11月20日
    AI 生成的摘要: The document discusses the use of analog switches and multiplexers in wideband applications, highlighting the HI-524 monolithic wideband CMOS multiplexer and the HA-2541 amplifier. It emphasizes the importance of unity gain stability, fast settling time, and output swing for driving coaxial cables. The HI-524 includes feedback resistance to minimize offset voltage. Proper layout is crucial to avoid feedthrough and excessive capacitance. The document also outlines Renesas Electronics' disclaimers on product use, quality grades, safety responsibilities, environmental compliance, and legal restrictions.
  5. 应用说明
    英语
    AN1033: Multiplexered Data Acquisition System Considerations
    PDF 302 KB an1033 1998年11月20日
    AI 生成的摘要: A CMOS multiplexer (MUX) can function as a demultiplexer by using synchronized address lines and capacitors to hold output signals between samples. However, overvoltage protection requires an external network. More precise demultiplexing uses sample-and-hold circuits like the HA-2420/2425 for each channel. The document also includes detailed disclaimers about product use, liability, quality grades, safety responsibilities, and regulatory compliance for Renesas Electronics products.
    6. 查看更多 (7)

    产品通告（产品变更、EOL 等） (7)

  1. 涨价通告
    英语
    PIN19006 - Price Increase for the Listed Renesas Electronics America Products
    PDF 257 KB PIN19006 2019年3月01日
  2. EOL 通告
    英语
    PLC18018 - General Q3 Product Life Cycle Notice
    PDF 388 KB PLC18018 2018年7月06日
  3. 涨价通告
    英语
    PIN17006 - Q1 2017 Price Increase
    PDF 227 KB PIN17006 2017年2月13日
  4. 产品咨询
    英语
    PA14064 - Minimum Line Quantity Change
    PDF 282 KB PA14064 2014年12月19日
  5. 产品变更通告
    英语
    PCN12085 - 8l, 14l, 16l SOIC w/ Gold Bond Wire @ ATP as Alternate Assembly Site
    PDF 152 KB PCN12085 2012年11月07日
    6. 查看更多 (7)

    营销资料 (1)

  1. 宣传手册
    英语
    Intersil Commercial Lab Services
    PDF 467 KB commercial-lab-services 2023年9月01日
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