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Capacitive Sensor Signal Conditioner with Digital Output

封装信息

CAD 模型: View CAD Model
Pkg. Type: WAFER
Pkg. Code: DICE
Lead Count (#):
Pkg. Dimensions (mm): 0.0 x 0.0 x 0.0
Pitch (mm):

环境和出口类别

Moisture Sensitivity Level (MSL) 1
Pb (Lead) Free Yes
ECCN (US) EAR99
HTS (US) 8542.39.0090

产品属性

Lead Count (#) 0
Carrier Type Wafer
Moisture Sensitivity Level (MSL) 1
Pkg. Dimensions (mm) 0.0 x 0.0 x 0.0
Qty. per Reel (#) 0
Qty. per Carrier (#) 0
Pb (Lead) Free Yes
Pb Free Category e3 Sn
Temp. Range (°C) -40 to +125°C
Country of Wafer Fabrication GERMANY
Adj. Analog Gain 2 - 8, 8 - 32, 32 - 130
Automotive Qual. No
Function Capacitive SSC
Input Type Single-capacitor
Interface I2C, SPI, PDM, Two Alarms
MOQ 9464
Pkg. Type WAFER
Qualification Level Standard
Requires Terms and Conditions Does not require acceptance of Terms and Conditions
Resolution (bits) 14
Sample Rate Max (KHz) 1
Supply Voltage (V) 2.3 - 5.5
Tape & Reel No
已发布 No

描述

The ZSSC3123 cLite™ is a CMOS integrated circuit for accurate capacitance-to-digital conversion and sensor-specific correction of capacitive sensor signals. Digital compensation of sensor offset, sensitivity and temperature drift is accomplished via an internal digital signal processor running a correction algorithm with calibration coefficients stored in a nonvolatile EEPROM. The ZSSC3123 is configurable for capacitive sensors with capacitances up to 260pF and a sensitivity of 125aF/LSB to 1pF/LSB depending on resolution, speed, and range settings. It is compatible with both single capacitive sensors (both terminals must be accessible) and differential capacitive sensors. Measured and corrected sensor values can be output as I²C, SPI, PDM, or alarms. The I²C interface can be used for a simple PC-controlled calibration procedure to program a set of calibration coefficients into an on-chip EEPROM. The calibrated ZSSC3123 and a specific sensor are mated digitally: fast, precise, and without the cost overhead of trimming by external devices or laser.