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概览

描述

The ISL71090SEH25EV1Z evaluation board is designed to measure the performance of the radiation hardened, ultra-low noise, high-precision ISL71090SEH voltage reference family. The reference has a wide input voltage range from 4V to 30V and an initial accuracy of 0.05%. Its ultra-low voltage noise (2μVP-P in the 0.1Hz to 10Hz range - ISL71090SEH25), a maximum output voltage temperature coefficient of 10ppm/°C, and excellent radiation performance make the ISL71090SEH ideal for space applications.

特性

  • Reference output voltage:
    • 2.5V ± 0.05%
  • Accuracy over temperature and radiation: ±0.15%
  • Output voltage noise:
    • 2µVP-P Typ. (0.1Hz to 10Hz)
  • Supply current: 930µA (Typ.)
  • Tempco (box method): 10ppm/°C Max
  • Output current capability: 20mA
  • Line regulation: 8ppm/V
  • Operating temperature range: -55°C to +125°C
  • Radiation environment
    • High dose rate: (50-300rad(Si)/s): 100krad(Si)
    • Low dose rate: (0.01rad(Si)/s): 100krad(Si)*
    • SET/SEL/SEB: 86MeV•cm2/mg*Product capability established by initial characterization. The "EH" version is acceptance tested on a wafer by wafer basis to 50krad(Si) at low dose rate

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