特性
- High-voltage type (20V Rating)
- Inverting type
- High sink current for driving 2 TTL loads
- High-to-low level logic conversion
- 100% tested for quiescent current at 20V
- Maximum input current of 1µA at 18V over full package temperature range; 100nA at 18V and +25 °C
- 5V, 10V and 15V parametric ratings
描述
The CD4049UBMS is an inverting hex buffer and features logic level conversion using only one supply voltage (VCC). The input signal high level (VIH) can exceed the VCC supply voltage when this device is used for logic-level conversions. This device is intended for use as CMOS to DTL/TTL converters and can drive directly two DTL/TTL loads. (VCC = 5V, VOL ≤ 0. 4V, and IOL ≥ 3. 3mA). The CD4049UBMS is designated as a replacement for the CD4009UB. Because the CD4049UBMS requires only one power supply, it is preferred over the CD4009UB and CD4010B and should be used in place of the CD4009UB in all inverter, current driver, or logic level conversion applications. In these applications, the CD4049UBMS is pin-compatible with the CD4009UB and can be substituted for this device in existing as well as in new designs. Terminal No. 16 is not connected internally on the CD4049UBMS; therefore, connection to this terminal is of no consequence to circuit operation. For applications not requiring high sink current or voltage conversion, the CD4069UB hex inverter is recommended. The CD4049UBMS is supplied in these 16-lead outline packages: Braze Seal DIP H4S, Frit Seal DIP H1E, Ceramic Flatpack H3X.
应用
- CMOS to DTL/TTL hex converter
- CMOS current "Sink" or "Source" driver
- CMOS high-to-low logic level converter
| Part Number | Status | Samples | Stock | RoHS | Package | Lead Count (#) | Carrier Type | Moisture Sensitivity Level (MSL) | Pitch (mm) | Pkg. Dimensions (mm) | DLA SMD | Pb (Lead) Free | Pb Free Category | MOQ | Temp. Range (°C) | CAGE code |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| CD4049UBDMSR | Obsolete | N/A | Out of Stock | Contact | SBDIP | 16# | Tube | Not Applicable | 2.5mm | 20.3 x 7.5 x 2.41 | 5962R9663601VEC | Exempt | Gold Plate over compliant Undercoat-e4 | 25 | -55 to +125°C | 34371 |
| CD4049UBHSR | Last Time Buy | Available | Out of Stock | RoHS:EN RoHS:JA | DIE | Die Waffle Pack | Not Applicable | 0.0 x 0.0 x 0.00 | 5962R9663601V9A | Yes | None | 100 | -55 to +125°C | 34371 | ||
| CD4049UBKMSR | Obsolete | N/A | Out of Stock | Contact | CFP | 16# | Tray | Not Applicable | 1.3mm | 10.4 x 6.9 x 0.00 | 5962R9663601VXC | Exempt | Gold Plate over compliant Undercoat-e4 | 25 | -55 to +125°C | 34371 |
| CD4049UBKNSR | Obsolete | N/A | Out of Stock | Contact | CFP | 16# | Tray | Not Applicable | 1.3mm | 10.4 x 6.9 x 0.00 | 5962R9663602VXC | Exempt | Gold Plate over compliant Undercoat-e4 | 25 | -55 to +125°C | 34371 |
- 涨价通告英语PDF 360 KB PIN19011 2019年4月10日
- 产品咨询英语PDF 499 KB PA11003 2011年1月05日
- 产品变更通告英语PDF 230 KB PCN10123 2010年12月06日
- 应用说明英语PDF 224 KB an9654 1999年5月05日AI 生成的摘要: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
推荐文档 (1)
数据手册 (1)
No Results Found.
确保所有关键词拼写正确。
尝试使用更少、不同或更宽泛的词语来改变搜索结果。
如果您使用了筛选器,请考虑取消选择某些筛选器选项以扩大搜索结果。
- 搜索我们丰富的知识库,帮助您解答常见问题
- 前往支持论坛,获取瑞萨电子技术专家和社群的帮助
- 应用说明英语PDF 224 KB an9654 1999年5月05日AI 生成的摘要: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
应用说明和白皮书 (1)
- 涨价通告英语PDF 360 KB PIN19011 2019年4月10日
- 产品咨询英语PDF 499 KB PA11003 2011年1月05日
- 产品变更通告英语PDF 230 KB PCN10123 2010年12月06日
产品通告(产品变更、EOL 等) (3)
No Results Found.
确保所有关键词拼写正确。
尝试使用更少、不同或更宽泛的词语来改变搜索结果。
如果您使用了筛选器,请考虑取消选择某些筛选器选项以扩大搜索结果。
- 搜索我们丰富的知识库,帮助您解答常见问题
- 前往支持论坛,获取瑞萨电子技术专家和社群的帮助
No Results Found.
确保所有关键词拼写正确。
尝试使用更少、不同或更宽泛的词语来改变搜索结果。
如果您使用了筛选器,请考虑取消选择某些筛选器选项以扩大搜索结果。
- 搜索我们丰富的知识库,帮助您解答常见问题
- 前往支持论坛,获取瑞萨电子技术专家和社群的帮助
No Results Found.
确保所有关键词拼写正确。
尝试使用更少、不同或更宽泛的词语来改变搜索结果。
如果您使用了筛选器,请考虑取消选择某些筛选器选项以扩大搜索结果。
- 搜索我们丰富的知识库,帮助您解答常见问题
- 前往支持论坛,获取瑞萨电子技术专家和社群的帮助
No Results Found.
确保所有关键词拼写正确。
尝试使用更少、不同或更宽泛的词语来改变搜索结果。
如果您使用了筛选器,请考虑取消选择某些筛选器选项以扩大搜索结果。
- 搜索我们丰富的知识库,帮助您解答常见问题
- 前往支持论坛,获取瑞萨电子技术专家和社群的帮助
No Results Found.
确保所有关键词拼写正确。
尝试使用更少、不同或更宽泛的词语来改变搜索结果。
如果您使用了筛选器,请考虑取消选择某些筛选器选项以扩大搜索结果。
- 搜索我们丰富的知识库,帮助您解答常见问题
- 前往支持论坛,获取瑞萨电子技术专家和社群的帮助
No Results Found.
确保所有关键词拼写正确。
尝试使用更少、不同或更宽泛的词语来改变搜索结果。
如果您使用了筛选器,请考虑取消选择某些筛选器选项以扩大搜索结果。
- 搜索我们丰富的知识库,帮助您解答常见问题
- 前往支持论坛,获取瑞萨电子技术专家和社群的帮助
营销资料 (1)
其他 (1)
No Results Found.
确保所有关键词拼写正确。
尝试使用更少、不同或更宽泛的词语来改变搜索结果。
如果您使用了筛选器,请考虑取消选择某些筛选器选项以扩大搜索结果。
- 搜索我们丰富的知识库,帮助您解答常见问题
- 前往支持论坛,获取瑞萨电子技术专家和社群的帮助