特性
- High Voltage Type (20V Rating)
- Expansion to 8, 12, 16 4N Bits by Cascading Units
- Medium Speed Operation Compares Two 4-Bit Words in 180ns (Typ.) at 10V
- 100% Tested for Quiescent Current at 20V
- Standardized Symmetrical Output Characteristics
- 5V, 10V and 15V Parametric Ratings
- Maximum Input Current of 1µA at 18V Over Full Package Temperature Range; 100nA at 18V and +25°C
- Noise Margin (Over Full Package/Temperature Range) 1V at VDD = 5V 2V at VDD = 10V 2.5V at VDD = 15V
- Meets All Requirements of JEDEC Tentative Standard No. 13B, "Standard Specifications for Description of 'B' Series CMOS Devices"
描述
Support is limited to customers who have already adopted these products.
CD4585BMS is a 4-bit magnitude comparator designed for use in computer and logic applications that require the comparison of two 4-bit words. This logic circuit determines whether one 4-bit word (Binary or BCD) is less than, equal to or greater than a second 4-bit word. The CD4585BMS has eight comparing inputs (A3, B3, through A0, B0), three outputs (A < B, = B, A > B) and three cascading inputs (A < B, A = B, A > B) that permit system designers to expand the comparator function to 8, 12, 16. . . 4N bits. When a single CD4585BMS is used, the cascading inputs are connected as follows: (A < B) = low, (A = B) = high, (A > B) = high. Cascading these units for comparison of more than 4 bits is accomplished as shown in Figure 9. The CD4585BMS is supplied in these 16-lead outline packages: Braze Seal DIP H4T Frit Seal DIP H1E Ceramic Flatpack H6W
应用
- Servo Motor Controls
- Process Controllers
| Part Number | Status | Samples | Stock | Package | Lead Count (#) | Carrier Type | Pitch (mm) | Pkg. Dimensions (mm) | DLA SMD | Pb (Lead) Free | MOQ | Temp. Range (°C) | CAGE code |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| CD4585BDMSR | Obsolete | N/A | Out of Stock | SBDIP | 16# | Tube | 2.5mm | 20.3 x 7.5 x 2.41 | 5962-96674 | No | 15 | -55 to +125°C | 34371 |
| CD4585BKMSR | Obsolete | N/A | Out of Stock | CFP | 16# | Tray | 1.3mm | 10.4 x 6.9 x 0.00 | 5962-96674 | No | 15 | -55 to +125°C | 34371 |
- 应用说明英语PDF 224 KB an9654 1999年5月05日AI 生成的摘要: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
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- 应用说明英语PDF 224 KB an9654 1999年5月05日AI 生成的摘要: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
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