特性
- This Circuit is Processed in Accordance to MIL-STD-883 and is Fully Conformant Under the Provisions of Paragraph 1.2.1.
- Digital Programmability
- High Slew Rate
- Uncompensated: 20V/µs Min
- Compensated: 6V/µs Min
- Wide Gain Bandwidth
- Uncompensated: 20MHz Min
- Compensated: 4MHz Min
- High Gain: 50kV/V
- Low Offset Current: 50nA
- Single Capacitor Compensation for Unity Gain
- DTL/TTL Compatible Inputs
描述
Support is limited to customers who have already adopted these products.
HA-2400/883 is a four-channel programmable amplifier providing a level of versatility unsurpassed by any other monolithic operational amplifier. Versatility is achieved by employing four input amplifier channels, any one (or none) of which may be electronically selected and connected to a single output stage through DTL/TTL compatible address inputs. The device formed by the output and the selected pair of inputs is an op amp which delivers excellent slew rate, gain bandwidth and power bandwidth performance. Other advantageous features for these dielectrically isolated amplifiers include high voltage gain and input impedance coupled with low input offset voltage and offset current. External compensation is not required on this device at closed loop gains greater than 10. Each channel of the HA-2400/883 can be controlled and operated with suitable feedback networks in any of the standard op amp configurations. This specialization makes these amplifiers excellent components for multiplexing, signal selection and mathematical function designs. With 20V/µs slew rate, 20MHz gain bandwidth and low input bias currents makes this device an ideal building block for signal generators, active filters and data acquisition designs. Programmability, coupled with 9mV typical offset voltage and 50nA offset current, makes these amplifiers outstanding components for signal conditioning circuits.
应用
- Single Selection/Multiplexing
- Op Amp Gain Stage
- Frequency Oscillator
- Filter Characteristics
- Add-Subtract Functions
- Integrator Characteristics
- Comparator Levels
| Part Number | Status | Samples | Stock | Package | Lead Count (#) | Carrier Type | Pb (Lead) Free | MOQ | Temp. Range (°C) | CAGE code |
|---|---|---|---|---|---|---|---|---|---|---|
| 5962-8778301EA | Obsolete | N/A | Out of Stock | CERDIP | 16# | Tube | No | 300 | -55 to +125°C | 34371 |
| HA1-2400/883 | Obsolete | N/A | Out of Stock | CERDIP | 16# | Tube | No | 300 | -55 to +125°C | 34371 |
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- 应用说明英语PDF 263 KB r13an0003eu0100-biasing-op-amps 2019年12月06日AI 生成的摘要: Proper biasing of operational amplifiers is essential to avoid malfunction in AC-coupled circuits. A missing DC bias path causes long stabilization times and potential failures. Adding input resistors to ground provides a DC path for bias currents, minimizing offset errors. For single-supply AC-coupled amplifiers, biasing uses a reference voltage, ideally from a high-PSRR voltage reference or buffered voltage divider, to maintain signal symmetry and reduce noise. Understanding frequency responses of input and feedback components is crucial for setting bandwidth and gain characteristics.
- EOL 通告英语PDF 200 KB PLC15033 2015年6月11日
- 产品变更通告英语PDF 174 KB PCN14017 2014年4月21日
- 产品变更通告英语PDF 151 KB PCN11040 2011年4月07日
- 应用说明英语PDF 357 KB an1694 2004年1月19日AI 生成的摘要: The document outlines the four fundamental internal blocks of an operational amplifier and presents a simple 2:1 stage circuit diagram. It includes important legal notices from Renesas Electronics regarding the use, liability, and intellectual property rights of their semiconductor products. The document clarifies product quality grades, intended applications, and restrictions on use in life-critical or hazardous systems. It emphasizes compliance with applicable laws and safety responsibilities when using Renesas products. Contact information for Renesas sales offices worldwide is also provided.
- 应用说明英语PDF 338 KB an9867 1999年11月10日AI 生成的摘要: Electrical parameters are monitored during life testing to detect drift and failures, defined by exceeding datasheet limits. New products require less than 1% failure during burn-in, with failure analysis and corrective actions if exceeded. Sampling plans ensure defect rates below 3%. Life tests last 1000-3000 hours at 125°C depending on process maturity. Failure mechanisms include electromigration, ionic contamination, hot carrier injection, and dielectric rupture. Product sign-off requires all parties' approval after reliability confirmation. Space products undergo burn-in and quality conformance inspections with strict failure limits. Derating is unnecessary as datasheet limits are set at 6-sigma from characterization data, ensuring reliability.
- 应用说明英语PDF 224 KB an9654 1999年5月05日AI 生成的摘要: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
- 应用说明英语PDF 148 KB an514 1998年8月19日AI 生成的摘要: The document presents various programmable analog circuit designs using HA-2400 amplifiers, including non-inverting and inverting amplifiers with selectable gains, programmable attenuators, adders/subtractors, phase selectors, integrators with reset, track-and-hold circuits, sine wave oscillators, multivibrators, and active filters. These circuits enable digital control of analog functions such as gain, phase, frequency, and filtering, facilitating flexible and precise signal processing applications.
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- 应用说明英语PDF 263 KB r13an0003eu0100-biasing-op-amps 2019年12月06日AI 生成的摘要: Proper biasing of operational amplifiers is essential to avoid malfunction in AC-coupled circuits. A missing DC bias path causes long stabilization times and potential failures. Adding input resistors to ground provides a DC path for bias currents, minimizing offset errors. For single-supply AC-coupled amplifiers, biasing uses a reference voltage, ideally from a high-PSRR voltage reference or buffered voltage divider, to maintain signal symmetry and reduce noise. Understanding frequency responses of input and feedback components is crucial for setting bandwidth and gain characteristics.
- 应用说明英语PDF 357 KB an1694 2004年1月19日AI 生成的摘要: The document outlines the four fundamental internal blocks of an operational amplifier and presents a simple 2:1 stage circuit diagram. It includes important legal notices from Renesas Electronics regarding the use, liability, and intellectual property rights of their semiconductor products. The document clarifies product quality grades, intended applications, and restrictions on use in life-critical or hazardous systems. It emphasizes compliance with applicable laws and safety responsibilities when using Renesas products. Contact information for Renesas sales offices worldwide is also provided.
- 应用说明英语PDF 338 KB an9867 1999年11月10日AI 生成的摘要: Electrical parameters are monitored during life testing to detect drift and failures, defined by exceeding datasheet limits. New products require less than 1% failure during burn-in, with failure analysis and corrective actions if exceeded. Sampling plans ensure defect rates below 3%. Life tests last 1000-3000 hours at 125°C depending on process maturity. Failure mechanisms include electromigration, ionic contamination, hot carrier injection, and dielectric rupture. Product sign-off requires all parties' approval after reliability confirmation. Space products undergo burn-in and quality conformance inspections with strict failure limits. Derating is unnecessary as datasheet limits are set at 6-sigma from characterization data, ensuring reliability.
- 应用说明英语PDF 224 KB an9654 1999年5月05日AI 生成的摘要: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
- 应用说明英语PDF 148 KB an514 1998年8月19日AI 生成的摘要: The document presents various programmable analog circuit designs using HA-2400 amplifiers, including non-inverting and inverting amplifiers with selectable gains, programmable attenuators, adders/subtractors, phase selectors, integrators with reset, track-and-hold circuits, sine wave oscillators, multivibrators, and active filters. These circuits enable digital control of analog functions such as gain, phase, frequency, and filtering, facilitating flexible and precise signal processing applications.
应用说明和白皮书 (5)
- EOL 通告英语PDF 200 KB PLC15033 2015年6月11日
- 产品变更通告英语PDF 174 KB PCN14017 2014年4月21日
- 产品变更通告英语PDF 151 KB PCN11040 2011年4月07日
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