特性
- This Circuit is Processed in Accordance to MIL-STD-883 and is Fully Conformant Under the Provisions of Paragraph 1.2.1.
- Low On Release: 100Ω Max
- Wide Analog Signal Range: ±15V
- TTL/CMOS Compatible: 2.4V (Logic 1)
- Turn-On Time: 500ns
- Analog Current Range (Continuous): 25mA
- No Latch-Up
- Replaces DG201
描述
The HI-201/883 is a monolithic device comprised of four independently selectable SPST switchers which feature fast switching speeds (185ns typical) combined with low power dissipation (15mW typical at +25°C). Each switch provides low ON resistance operation for input signal voltages up to the supply rails and for signal currents up to 25mA continuous. Rugged DI construction eliminates latchup and substrate SCR failure modes. All devices provide break-before-make switching and are TTL and CMOS compatible for maximum application versatility. The HI-201/883 is an ideal component for use in high frequency analog switching. Typical applications include signal path switching, sample and hold circuits, digital filters, and op amp gain switching networks. HI-201/883 is available in a 16 Ld CerDIP package.
产品参数
| 属性 | 值 |
|---|---|
| Rating | MIL-STD-883 |
| Switches (#) | 4 |
| RON (max) (ohms) | 55 |
| Supply Voltage (min) (V) | -20 - -20 |
| Supply Voltage (max) (V) | 20 - 20 |
| Turn-Off Time (max) (ns) | 650 |
| Turn-On Time (max) (ns) | 800 |
| Temp. Range (°C) | -55 to +125°C |
| Flow | Harsh Environment & MIL-STD-883 |
| Qualification Level | Class Q |
| Die Sale Availability? | No |
封装选项
| Pkg. Type | Pkg. Dimensions (mm) | Lead Count (#) | Pitch (mm) |
|---|---|---|---|
| CERDIP | 19.3 x 7.3 x 0.00 | 16 | 2.5 |
应用
- High Frequency Analog Switching
- Sample and Hold Circuits
- Digital Filters
- Op Amp Gain Switching Networks
| Part Number | Status | Samples | Stock | Package | Lead Count (#) | Carrier Type | Moisture Sensitivity Level (MSL) | Pb (Lead) Free | Pb Free Category | MOQ | Temp. Range (°C) | CAGE code |
|---|---|---|---|---|---|---|---|---|---|---|---|---|
| 7705302EA | Active | Available | In Stock | CERDIP | 16# | Tube | Not Applicable | No | Hot Solder Dip | 500 | -55 to +125°C | 34371 |
| HI1-0201/883 | Active | Available | Out of Stock | CERDIP | 16# | Tube | Not Applicable | No | Hot Solder Dip | 500 | -55 to +125°C | 34371 |
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- 产品变更通告英语PDF 323 KB PCN15064 2015年12月22日
- 产品变更通告英语PDF 174 KB PCN14017 2014年4月21日
- 产品变更通告英语PDF 151 KB PCN11040 2011年4月07日
- 应用说明英语PDF 313 KB an532 2005年7月11日AI 生成的摘要: CMOS analog switches can operate with single or dual power supplies, but single supply operation often increases on resistance and switching times due to lower gate-source bias voltage. The HI-300 series can run on a single +5V supply but with reduced performance. Pin functions vary by device, such as VL, VR, and VREF, which adjust logic threshold levels for TTL or CMOS logic compatibility. Switch functions correspond to a logic HIGH input. Absolute maximum ratings are limits beyond which damage may occur, and on resistance varies due to manufacturing and lot differences, typically within ±10%. Renesas disclaims liability for use outside specified conditions and emphasizes compliance with safety and legal standards.
- 应用说明英语PDF 468 KB an557 2002年5月24日AI 生成的摘要: The document details recommended test procedures for analog switches, focusing on key parameters such as crosstalk, break-before-make delay, and settling time. It explains how to measure crosstalk using decibel ratios and outlines the importance of break-before-make delay to prevent simultaneous switch closure. Settling time is measured to ensure output stability after input changes. It also covers input thresholds, leakage currents, power dissipation, and various switch capacitances, providing test circuit examples and conditions for accurate measurement.
- 应用说明英语PDF 338 KB an9867 1999年11月10日AI 生成的摘要: Electrical parameters are monitored during life testing to detect drift and failures, defined by exceeding datasheet limits. New products require less than 1% failure during burn-in, with failure analysis and corrective actions if exceeded. Sampling plans ensure defect rates below 3%. Life tests last 1000-3000 hours at 125°C depending on process maturity. Failure mechanisms include electromigration, ionic contamination, hot carrier injection, and dielectric rupture. Product sign-off requires all parties' approval after reliability confirmation. Space products undergo burn-in and quality conformance inspections with strict failure limits. Derating is unnecessary as datasheet limits are set at 6-sigma from characterization data, ensuring reliability.
- 应用说明英语PDF 224 KB an9654 1999年5月05日AI 生成的摘要: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
- 应用说明英语PDF 300 KB an1034 1998年11月20日AI 生成的摘要: The document discusses the use of analog switches and multiplexers in wideband applications, highlighting the HI-524 monolithic wideband CMOS multiplexer and the HA-2541 amplifier. It emphasizes the importance of unity gain stability, fast settling time, and output swing for driving coaxial cables. The HI-524 includes feedback resistance to minimize offset voltage. Proper layout is crucial to avoid feedthrough and excessive capacitance. The document also outlines Renesas Electronics' disclaimers on product use, quality grades, safety responsibilities, environmental compliance, and legal restrictions.
- 应用说明英语PDF 270 KB an520 1998年11月20日AI 生成的摘要: Adding a pull-up resistor from CMOS inputs to +5V is essential when interfacing TTL outputs with CMOS inputs to improve interchangeability, noise immunity, compatibility, and reliability. A 2kΩ resistor is generally sufficient. CMOS inputs are compatible with CMOS logic at 5V to 15V without pull-ups. Mechanical switches require pull-up or pull-down resistors to prevent noise and contact issues. Renesas disclaims liability for misuse and emphasizes adherence to product specifications and legal regulations.
- 应用说明英语PDF 201 KB an9402 1994年1月29日
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- 应用说明英语PDF 313 KB an532 2005年7月11日AI 生成的摘要: CMOS analog switches can operate with single or dual power supplies, but single supply operation often increases on resistance and switching times due to lower gate-source bias voltage. The HI-300 series can run on a single +5V supply but with reduced performance. Pin functions vary by device, such as VL, VR, and VREF, which adjust logic threshold levels for TTL or CMOS logic compatibility. Switch functions correspond to a logic HIGH input. Absolute maximum ratings are limits beyond which damage may occur, and on resistance varies due to manufacturing and lot differences, typically within ±10%. Renesas disclaims liability for use outside specified conditions and emphasizes compliance with safety and legal standards.
- 应用说明英语PDF 468 KB an557 2002年5月24日AI 生成的摘要: The document details recommended test procedures for analog switches, focusing on key parameters such as crosstalk, break-before-make delay, and settling time. It explains how to measure crosstalk using decibel ratios and outlines the importance of break-before-make delay to prevent simultaneous switch closure. Settling time is measured to ensure output stability after input changes. It also covers input thresholds, leakage currents, power dissipation, and various switch capacitances, providing test circuit examples and conditions for accurate measurement.
- 应用说明英语PDF 338 KB an9867 1999年11月10日AI 生成的摘要: Electrical parameters are monitored during life testing to detect drift and failures, defined by exceeding datasheet limits. New products require less than 1% failure during burn-in, with failure analysis and corrective actions if exceeded. Sampling plans ensure defect rates below 3%. Life tests last 1000-3000 hours at 125°C depending on process maturity. Failure mechanisms include electromigration, ionic contamination, hot carrier injection, and dielectric rupture. Product sign-off requires all parties' approval after reliability confirmation. Space products undergo burn-in and quality conformance inspections with strict failure limits. Derating is unnecessary as datasheet limits are set at 6-sigma from characterization data, ensuring reliability.
- 应用说明英语PDF 224 KB an9654 1999年5月05日AI 生成的摘要: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
- 应用说明英语PDF 300 KB an1034 1998年11月20日AI 生成的摘要: The document discusses the use of analog switches and multiplexers in wideband applications, highlighting the HI-524 monolithic wideband CMOS multiplexer and the HA-2541 amplifier. It emphasizes the importance of unity gain stability, fast settling time, and output swing for driving coaxial cables. The HI-524 includes feedback resistance to minimize offset voltage. Proper layout is crucial to avoid feedthrough and excessive capacitance. The document also outlines Renesas Electronics' disclaimers on product use, quality grades, safety responsibilities, environmental compliance, and legal restrictions.查看更多 (7)
应用说明和白皮书 (7)
- 产品变更通告英语PDF 323 KB PCN15064 2015年12月22日
- 产品变更通告英语PDF 174 KB PCN14017 2014年4月21日
- 产品变更通告英语PDF 151 KB PCN11040 2011年4月07日
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