特性
- This Circuit is Processed in Accordance to MIL-STD-883 and is Fully Conformant Under the Provisions of Paragraph 1.2.1.
- Low On Release: 50Ω Max
- Wide Analog Signal Range: ±15V
- Turn-On Time: 50ns
- Analog Current Range (Continuous): 25mA
- TTL/CMOS Compatible
- No Latch-Up
- Pin Compatible with Standard HI-201
描述
The HI-201HS/883 is a monolithic CMOS analog switch featuring very fast switching speeds and low ON resistance. This integrated circuit consists of four independently selectable SPST switches and is pin compatible with the industry standard HI-201 switch. Fabricated using silicon-gate technology and the Renesas dielectric isolation process, this TTL compatible device offers improved performance over previously available CMOS analog switches while eliminating the problem of latch-up associated with other fabrication processes. Featuring maximum switching times of 50ns, low ON resistance of 50Ω maximum, and a wide analog signal range, the HI-201HS/883 is designed for any military application where improved switching performance, particularly switching speed, is required. (A more detailed discussion on the design and application of the HI-201HS/883 can be found in Application Note AN543. ) The HI-201HS/883 is available in a 16 Ld CerDIP package and is specified over the temperature range of -55°C to +125°C.
产品参数
| 属性 | 值 |
|---|---|
| Rating | MIL-STD-883 |
| Switches (#) | 4 |
| RON (max) (ohms) | 30 |
| Supply Voltage (min) (V) | -15 - -15 |
| Supply Voltage (max) (V) | 15 - 15 |
| Turn-Off Time (max) (ns) | 100 |
| Turn-On Time (max) (ns) | 100 |
| Temp. Range (°C) | -55 to +125°C |
| Flow | Harsh Environment & MIL-STD-883 |
| Qualification Level | Class Q |
| Die Sale Availability? | No |
应用
- High Speed Multiplexing
- High Frequency Analog Switching
- Sample and Hold Circuits
- Digital Filters
- Op Amp Gain Switching Networks
- Integrator Reset Circuits
| Part Number | Status | Samples | Stock | Package | Lead Count (#) | Carrier Type | Moisture Sensitivity Level (MSL) | Pitch (mm) | Pkg. Dimensions (mm) | Pb (Lead) Free | Pb Free Category | MOQ | Temp. Range (°C) | CAGE code |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| 5962-86716012A | Active | Available | Out of Stock | CLCC | 20# | Tube | Not Applicable | 1.3mm | 8.9 x 8.9 x 0.00 | No | Hot Solder Dip | 112 | -55 to +125°C | 34371 |
| 5962-8671601EA | Active | Available | Out of Stock | CERDIP | 16# | Tube | Not Applicable | 2.5mm | 19.3 x 7.3 x 0.00 | No | Hot Solder Dip | 300 | -55 to +125°C | 34371 |
| HI1-0201HS/883 | Active | Available | Out of Stock | CERDIP | 16# | Tube | Not Applicable | 2.5mm | 19.3 x 7.3 x 0.00 | No | Hot Solder Dip | 500 | -55 to +125°C | 34371 |
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- 应用说明英语PDF 468 KB an557 2002年5月24日AI 生成的摘要: The document details recommended test procedures for analog switches, focusing on key parameters such as crosstalk, break-before-make delay, and settling time. It explains how to measure crosstalk using decibel ratios and outlines the importance of break-before-make delay to prevent simultaneous switch closure. Settling time is measured to ensure output stability after input changes. It also covers input thresholds, leakage currents, power dissipation, and various switch capacitances, providing test circuit examples and conditions for accurate measurement.
- 应用说明英语PDF 224 KB an9654 1999年5月05日AI 生成的摘要: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
- 应用说明英语PDF 300 KB an1034 1998年11月20日AI 生成的摘要: The document discusses the use of analog switches and multiplexers in wideband applications, highlighting the HI-524 monolithic wideband CMOS multiplexer and the HA-2541 amplifier. It emphasizes the importance of unity gain stability, fast settling time, and output swing for driving coaxial cables. The HI-524 includes feedback resistance to minimize offset voltage. Proper layout is crucial to avoid feedthrough and excessive capacitance. The document also outlines Renesas Electronics' disclaimers on product use, quality grades, safety responsibilities, environmental compliance, and legal restrictions.
- 应用说明英语PDF 270 KB an520 1998年11月20日AI 生成的摘要: Adding a pull-up resistor from CMOS inputs to +5V is essential when interfacing TTL outputs with CMOS inputs to improve interchangeability, noise immunity, compatibility, and reliability. A 2kΩ resistor is generally sufficient. CMOS inputs are compatible with CMOS logic at 5V to 15V without pull-ups. Mechanical switches require pull-up or pull-down resistors to prevent noise and contact issues. Renesas disclaims liability for misuse and emphasizes adherence to product specifications and legal regulations.
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- 应用说明英语PDF 468 KB an557 2002年5月24日AI 生成的摘要: The document details recommended test procedures for analog switches, focusing on key parameters such as crosstalk, break-before-make delay, and settling time. It explains how to measure crosstalk using decibel ratios and outlines the importance of break-before-make delay to prevent simultaneous switch closure. Settling time is measured to ensure output stability after input changes. It also covers input thresholds, leakage currents, power dissipation, and various switch capacitances, providing test circuit examples and conditions for accurate measurement.
- 应用说明英语PDF 224 KB an9654 1999年5月05日AI 生成的摘要: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
- 应用说明英语PDF 300 KB an1034 1998年11月20日AI 生成的摘要: The document discusses the use of analog switches and multiplexers in wideband applications, highlighting the HI-524 monolithic wideband CMOS multiplexer and the HA-2541 amplifier. It emphasizes the importance of unity gain stability, fast settling time, and output swing for driving coaxial cables. The HI-524 includes feedback resistance to minimize offset voltage. Proper layout is crucial to avoid feedthrough and excessive capacitance. The document also outlines Renesas Electronics' disclaimers on product use, quality grades, safety responsibilities, environmental compliance, and legal restrictions.
- 应用说明英语PDF 270 KB an520 1998年11月20日AI 生成的摘要: Adding a pull-up resistor from CMOS inputs to +5V is essential when interfacing TTL outputs with CMOS inputs to improve interchangeability, noise immunity, compatibility, and reliability. A 2kΩ resistor is generally sufficient. CMOS inputs are compatible with CMOS logic at 5V to 15V without pull-ups. Mechanical switches require pull-up or pull-down resistors to prevent noise and contact issues. Renesas disclaims liability for misuse and emphasizes adherence to product specifications and legal regulations.
应用说明和白皮书 (4)
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