特性
- Wide Analog Signal Range ±15V
- Low "ON" Resistance 25Ω
- High Current Capability 80mA
- Break-Before-Make Switching
- Turn-On Time 370ns
- Turn-Off Time 280ns
- No Latch-Up
- Input MOS Gates are Protected from Electrostatic Discharge
- DTL, TTL, CMOS, PMOS Compatible
- Pb-Free Available (RoHS Compliant)
描述
This family of CMOS analog switches offers low resistance switching performance for analog voltages up to the supply rails and for signal currents up to 80mA. ON resistance is low and stays reasonably constant over the full range of operating signal voltage and current. rON remains exceptionally constant for input voltages between +5V and -5V and currents up to 50mA. Switch impedance also changes very little over temperature, particularly between 0°C and 75°C. rON is nominally 25Ω for HI-5049 and HI-5051 and 50Ω for HI-5042 through HI-5047. All devices provide break-before-make switching and are TTL and CMOS compatible for maximum application versatility. Performance is further enhanced by Dielectric Isolation processing which insures latch-free operation with very low input and output leakage currents (0. 8nA at 25°C). This family of switches also features very low power operation (1. 5mW at 25°C). There are 7 devices in this switch series which are differentiated by type of switch action and value of rON (see Functional Description Table). The HI-504X and HI-505X series switches can directly replace IH-5040 series devices, and are functionally compatible with the DG180 and DG190 family.
应用
- High Frequency Switching
- Sample and Hold
- Digital Filters
- Operational Amplifier Gain Switching
| Part Number | Status | Samples | Stock | Package | Lead Count (#) | Carrier Type | Moisture Sensitivity Level (MSL) | Pb (Lead) Free | Pb Free Category | MOQ | Temp. Range (°C) | CAGE code |
|---|---|---|---|---|---|---|---|---|---|---|---|---|
| HI1-5042-2 | Obsolete | N/A | Out of Stock | CERDIP | 16# | Tube | Not Applicable | No | Hot Solder Dip | 500 | -55 to +125°C | 34371 |
- 产品变更通告英语PDF 147 KB PCN11039 2011年4月07日
- 应用说明英语PDF 468 KB an557 2002年5月24日AI 生成的摘要: The document details recommended test procedures for analog switches, focusing on key parameters such as crosstalk, break-before-make delay, and settling time. It explains how to measure crosstalk using decibel ratios and outlines the importance of break-before-make delay to prevent simultaneous switch closure. Settling time is measured to ensure output stability after input changes. It also covers input thresholds, leakage currents, power dissipation, and various switch capacitances, providing test circuit examples and conditions for accurate measurement.
- 数据手册英语PDF 493 KB hi-5042-43-47-49-51 1999年10月27日
- 应用说明英语PDF 224 KB an9654 1999年5月05日AI 生成的摘要: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
- 应用说明英语PDF 300 KB an1034 1998年11月20日AI 生成的摘要: The document discusses the use of analog switches and multiplexers in wideband applications, highlighting the HI-524 monolithic wideband CMOS multiplexer and the HA-2541 amplifier. It emphasizes the importance of unity gain stability, fast settling time, and output swing for driving coaxial cables. The HI-524 includes feedback resistance to minimize offset voltage. Proper layout is crucial to avoid feedthrough and excessive capacitance. The document also outlines Renesas Electronics' disclaimers on product use, quality grades, safety responsibilities, environmental compliance, and legal restrictions.
- 应用说明英语PDF 270 KB an520 1998年11月20日AI 生成的摘要: Adding a pull-up resistor from CMOS inputs to +5V is essential when interfacing TTL outputs with CMOS inputs to improve interchangeability, noise immunity, compatibility, and reliability. A 2kΩ resistor is generally sufficient. CMOS inputs are compatible with CMOS logic at 5V to 15V without pull-ups. Mechanical switches require pull-up or pull-down resistors to prevent noise and contact issues. Renesas disclaims liability for misuse and emphasizes adherence to product specifications and legal regulations.
- 数据手册英语PDF 493 KB hi-5042-43-47-49-51 1999年10月27日
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- 数据手册英语PDF 493 KB hi-5042-43-47-49-51 1999年10月27日
数据手册 (1)
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- 应用说明英语PDF 468 KB an557 2002年5月24日AI 生成的摘要: The document details recommended test procedures for analog switches, focusing on key parameters such as crosstalk, break-before-make delay, and settling time. It explains how to measure crosstalk using decibel ratios and outlines the importance of break-before-make delay to prevent simultaneous switch closure. Settling time is measured to ensure output stability after input changes. It also covers input thresholds, leakage currents, power dissipation, and various switch capacitances, providing test circuit examples and conditions for accurate measurement.
- 应用说明英语PDF 224 KB an9654 1999年5月05日AI 生成的摘要: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
- 应用说明英语PDF 300 KB an1034 1998年11月20日AI 生成的摘要: The document discusses the use of analog switches and multiplexers in wideband applications, highlighting the HI-524 monolithic wideband CMOS multiplexer and the HA-2541 amplifier. It emphasizes the importance of unity gain stability, fast settling time, and output swing for driving coaxial cables. The HI-524 includes feedback resistance to minimize offset voltage. Proper layout is crucial to avoid feedthrough and excessive capacitance. The document also outlines Renesas Electronics' disclaimers on product use, quality grades, safety responsibilities, environmental compliance, and legal restrictions.
- 应用说明英语PDF 270 KB an520 1998年11月20日AI 生成的摘要: Adding a pull-up resistor from CMOS inputs to +5V is essential when interfacing TTL outputs with CMOS inputs to improve interchangeability, noise immunity, compatibility, and reliability. A 2kΩ resistor is generally sufficient. CMOS inputs are compatible with CMOS logic at 5V to 15V without pull-ups. Mechanical switches require pull-up or pull-down resistors to prevent noise and contact issues. Renesas disclaims liability for misuse and emphasizes adherence to product specifications and legal regulations.
应用说明和白皮书 (4)
- 产品变更通告英语PDF 147 KB PCN11039 2011年4月07日
产品通告(产品变更、EOL 等) (2)
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