特性
- This Circuit is Processed in Accordance to MIL-STD-883 and is Fully Conformant Under the Provisions of Paragraph 1.2.1.
- Low On Resistance (Max). . . . . . . . . . . . . . . .400Ω
- Wide Analog Signal Range . . . . . . . . . . . . . . .±15V
- TTL/CMOS Compatible . . . . . . . . . . . 2.4V (Logic "1")
- Access Time (Max) . . . . . . . . . . . . . . . . . .1.0µs
- 44V Maximum Power Supply
- Break-Before-Make Switching
- No Latch-up
描述
The HI-508/883 is an eight channel single-ended multiplexer. This monolithic CMOS multiplexer includes an array of eight analog switches, a digital decode circuit for channel selection, a voltage reference for logic thresholds, and an ENABLE input for device selection when several multiplexers are present. The Dielectric Isolation (DI) process used in fabrication of this device eliminates the problem of latch-up. Also, DI offers much lower substrate leakage and parasitic capacitance than conventional junction-isolated CMOS. Switches are guaranteed to break-before-make, so that two channels are never shorted together. The switching threshold for each digital input is established by an internal +5V reference, providing a guaranteed minimum 2. 4V for logic “1” and Maximum 0. 8V for logic “0”. This allows direct interface without pull-up resistors to signals from most logic families: CMOS, TTL, DTL and some PMOS. For protection against transient overvoltage, the digital inputs include a series 200Ω resistor and a diode clamp to each supply. If input overvoltage protection is needed, the HI-548/883 and HI-549/883 multiplexers are recommended. For further information see Application Note AN520.
产品参数
| 属性 | 值 |
|---|---|
| Rating | MIL-STD-883 |
| Configuration | Single 8:1 |
| Negative Supply Current (max) (mA) | -1 |
| Positive Supply Current (max) (mA) | 3 |
| Supply Voltage Range (V) | ±10 |
| Transition Time (max) | 1.2µs |
| Temp. Range (°C) | -55 to +125°C |
| Flow | Harsh Environment & MIL-STD-883 |
| Qualification Level | Class Q |
| Die Sale Availability? | No |
| PROTO Availability? | No |
应用
- Data Acquisition Systems
- Precision Instrumentation
- Demultiplexing
- Selector Switch
| Part Number | Status | Samples | Stock | Package | Lead Count (#) | Carrier Type | Moisture Sensitivity Level (MSL) | Pkg. Dimensions (mm) | Pb (Lead) Free | Pb Free Category | MOQ | Temp. Range (°C) | CAGE code |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| 7705201EC | Active | Available | In Stock | SBDIP | 16# | Tube | Not Applicable | 20.3 x 7.5 x 2.41 | Exempt | Gold Plate-e4 | 230 | -55 to +125°C | 34371 |
| HI1-0508/883 | Active | Available | In Stock | CERDIP | 16# | Tube | Not Applicable | 19.3 x 7.3 x 0.00 | No | Hot Solder Dip | 500 | -55 to +125°C | 34371 |
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- 产品变更通告英语PDF 260 KB PCN16087 2016年9月30日
- 产品变更通告英语PDF 323 KB PCN15064 2015年12月22日
- 产品变更通告英语PDF 174 KB PCN14017 2014年4月21日
- 产品变更通告英语PDF 151 KB PCN11040 2011年4月07日
- 应用说明英语PDF 468 KB an557 2002年5月24日AI 生成的摘要: The document details recommended test procedures for analog switches, focusing on key parameters such as crosstalk, break-before-make delay, and settling time. It explains how to measure crosstalk using decibel ratios and outlines the importance of break-before-make delay to prevent simultaneous switch closure. Settling time is measured to ensure output stability after input changes. It also covers input thresholds, leakage currents, power dissipation, and various switch capacitances, providing test circuit examples and conditions for accurate measurement.
- 应用说明英语PDF 338 KB an9867 1999年11月10日AI 生成的摘要: Electrical parameters are monitored during life testing to detect drift and failures, defined by exceeding datasheet limits. New products require less than 1% failure during burn-in, with failure analysis and corrective actions if exceeded. Sampling plans ensure defect rates below 3%. Life tests last 1000-3000 hours at 125°C depending on process maturity. Failure mechanisms include electromigration, ionic contamination, hot carrier injection, and dielectric rupture. Product sign-off requires all parties' approval after reliability confirmation. Space products undergo burn-in and quality conformance inspections with strict failure limits. Derating is unnecessary as datasheet limits are set at 6-sigma from characterization data, ensuring reliability.
- 应用说明英语PDF 224 KB an9654 1999年5月05日AI 生成的摘要: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
- 应用说明英语PDF 300 KB an1034 1998年11月20日AI 生成的摘要: The document discusses the use of analog switches and multiplexers in wideband applications, highlighting the HI-524 monolithic wideband CMOS multiplexer and the HA-2541 amplifier. It emphasizes the importance of unity gain stability, fast settling time, and output swing for driving coaxial cables. The HI-524 includes feedback resistance to minimize offset voltage. Proper layout is crucial to avoid feedthrough and excessive capacitance. The document also outlines Renesas Electronics' disclaimers on product use, quality grades, safety responsibilities, environmental compliance, and legal restrictions.
- 应用说明英语PDF 302 KB an1033 1998年11月20日AI 生成的摘要: A CMOS multiplexer (MUX) can function as a demultiplexer by using synchronized address lines and capacitors to hold output signals between samples. However, overvoltage protection requires an external network. More precise demultiplexing uses sample-and-hold circuits like the HA-2420/2425 for each channel. The document also includes detailed disclaimers about product use, liability, quality grades, safety responsibilities, and regulatory compliance for Renesas Electronics products.
- 应用说明英语PDF 270 KB an520 1998年11月20日AI 生成的摘要: Adding a pull-up resistor from CMOS inputs to +5V is essential when interfacing TTL outputs with CMOS inputs to improve interchangeability, noise immunity, compatibility, and reliability. A 2kΩ resistor is generally sufficient. CMOS inputs are compatible with CMOS logic at 5V to 15V without pull-ups. Mechanical switches require pull-up or pull-down resistors to prevent noise and contact issues. Renesas disclaims liability for misuse and emphasizes adherence to product specifications and legal regulations.
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- 应用说明英语PDF 468 KB an557 2002年5月24日AI 生成的摘要: The document details recommended test procedures for analog switches, focusing on key parameters such as crosstalk, break-before-make delay, and settling time. It explains how to measure crosstalk using decibel ratios and outlines the importance of break-before-make delay to prevent simultaneous switch closure. Settling time is measured to ensure output stability after input changes. It also covers input thresholds, leakage currents, power dissipation, and various switch capacitances, providing test circuit examples and conditions for accurate measurement.
- 应用说明英语PDF 338 KB an9867 1999年11月10日AI 生成的摘要: Electrical parameters are monitored during life testing to detect drift and failures, defined by exceeding datasheet limits. New products require less than 1% failure during burn-in, with failure analysis and corrective actions if exceeded. Sampling plans ensure defect rates below 3%. Life tests last 1000-3000 hours at 125°C depending on process maturity. Failure mechanisms include electromigration, ionic contamination, hot carrier injection, and dielectric rupture. Product sign-off requires all parties' approval after reliability confirmation. Space products undergo burn-in and quality conformance inspections with strict failure limits. Derating is unnecessary as datasheet limits are set at 6-sigma from characterization data, ensuring reliability.
- 应用说明英语PDF 224 KB an9654 1999年5月05日AI 生成的摘要: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
- 应用说明英语PDF 300 KB an1034 1998年11月20日AI 生成的摘要: The document discusses the use of analog switches and multiplexers in wideband applications, highlighting the HI-524 monolithic wideband CMOS multiplexer and the HA-2541 amplifier. It emphasizes the importance of unity gain stability, fast settling time, and output swing for driving coaxial cables. The HI-524 includes feedback resistance to minimize offset voltage. Proper layout is crucial to avoid feedthrough and excessive capacitance. The document also outlines Renesas Electronics' disclaimers on product use, quality grades, safety responsibilities, environmental compliance, and legal restrictions.
- 应用说明英语PDF 302 KB an1033 1998年11月20日AI 生成的摘要: A CMOS multiplexer (MUX) can function as a demultiplexer by using synchronized address lines and capacitors to hold output signals between samples. However, overvoltage protection requires an external network. More precise demultiplexing uses sample-and-hold circuits like the HA-2420/2425 for each channel. The document also includes detailed disclaimers about product use, liability, quality grades, safety responsibilities, and regulatory compliance for Renesas Electronics products.查看更多 (7)
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- 产品变更通告英语PDF 260 KB PCN16087 2016年9月30日
- 产品变更通告英语PDF 323 KB PCN15064 2015年12月22日
- 产品变更通告英语PDF 174 KB PCN14017 2014年4月21日
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