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100V, 60A Enhancement Mode GaN Power Transistor

封装信息

CAD 模型:View CAD Model
Pkg. Type:CLCC
Pkg. Code:JSC
Lead Count (#):4
Pkg. Dimensions (mm):9.0 x 4.7 x 1.83
Pitch (mm):

环境和出口类别

Moisture Sensitivity Level (MSL)Not Applicable
Pb (Lead) FreeYes
ECCN (US)9A515.e.1
HTS (US)8542.39.0090

产品属性

Pkg. TypeCLCC
Lead Count (#)4
Carrier TypeTray
Moisture Sensitivity Level (MSL)Not Applicable
Pkg. Dimensions (mm)9.0 x 4.7 x 1.83
Qualification LevelClass Ve
Pb (Lead) FreeYes
Pb Free CategoryGold Plate over compliant Undercoat-e4
MOQ25
Temp. Range (°C)-55 to +125°C
CAGE code34371
ApplicationSwitching regulation, Relay and Motor drives, Down hole drilling, High reliability industrial, Inrush protection
DSEE (MeV·cm2/mg)86
Die Sale Availability?Yes
FlowRH Hermetic
FunctionVery low rDS(ON) 5mΩ (typical), Ultra low total gate charge 14nC (typical), SEE hardness, Radiation accepting testing, Ultra small hermetically sealed 4 Ld SMD package
IDS (A)60
Length (mm)9
Models AvailableSPICE
PROTO Availability?Yes
Product CategoryRad Hard GaN FETs
Qg typ (nC)2.5
RDSON (Typ) (mΩ)5
RatingSpace
TID HDR (krad(Si))100
TID LDR (krad(Si))75
Thermal Resistance θJC (°C/W)3.1
Thickness (mm)1.83
VDS (V)100
VGS (Max) (V)6
VGS(TH) (Max) (V)2.5
Width (mm)4.7

描述

The ISL70023SEH and ISL73023SEH are 100V N-channel enhancement mode GaN power transistors. These GaN FETs have been characterized for destructive Single Event Effects (SEE) and tested for Total Ionizing Dose (TID) radiation. Applications for these devices include commercial aerospace, medical, and nuclear power generation. GaN's exceptionally high electron mobility and low temperature coefficient allows for very low rDS(ON), while its lateral device structure and majority carrier diode provide exceptionally low QG and zero QRR. The end result is a device that can operate at a higher switching frequency with more efficiency while reducing the overall solution size. By combining the exceptional performance of the GaN FET in a hermetically sealed Surface Mount Device (SMD) package with manufacturing in a MIL-PRF-38535 like flow results in best-in-class power transistors that are ideally suited for high reliability applications.