特性
- Electrically screened to SMD # 5962-07218
- QML qualified per MIL-PRF-38535 requirements
- Radiation tolerance
- High dose rate (50-300rad(Si)/s): 100krad(Si)
- Low dose rate (0.01rad(Si)/s): 50krad(Si)*
- SEL immune: Bonded wafer dielectric isolation
- NPN gain bandwidth product (FT: 8GHz (typ)
- NPN current gain (hFE): 130 (typ)
- NPN early voltage (VA): 50V (typ)
- PNP gain bandwidth product (FT): 5.5GHz (typ)
- PNP current gain (hFE): 60 (typ)
- PNP early voltage (VA): 20V (typ)
- Noise figure (50Ω) at 1GHz: 3.5dB (typ)
- Collector-to-collector leakage: <1pA (typ)
- Complete isolation between transistors * Limit established by characterization
描述
The ISL73096, ISL73127 and ISL73128 are radiation hardened bipolar transistor arrays. The ISL73096 consists of three NPN transistors and two PNP transistors on a common substrate. The ISL73127 consists of five NPN transistors on a common substrate. The ISL73128 consists of five PNP transistors on a common substrate. The ISL73096EH, ISL73127EH and ISL73128EH devices encompass all of the production testing of the ISL73096RH, ISL73127RH and ISL73128RH devices and additionally are tested in the Intersil Enhanced Low Dose Rate Sensitivity (ELDERS) product manufacturing flow. One of our bonded wafer, dielectrically isolated fabrication processes provides an immunity to single event latch-up and the capability of highly reliable performance in a radiation environment. The high gain-bandwidth product and low noise figure of these transistors make them ideal for use in high frequency amplifier and mixer applications. Monolithic construction of the NPN and PNP transistors provides the closest electrical and thermal matching possible. Access is provided to each terminal of the transistors for maximum application flexibility.
产品参数
| 属性 | 值 |
|---|---|
| Rating | Space |
| NPN Transistors (#) | 5 |
| PNP Transistors (#) | 5 |
| Temp. Range (°C) | -40 to +105°C, -40 to +125°C, -55 to +125°C |
| TID HDR (krad(Si)) | 100 |
| Flow | RH Hermetic |
| Qualification Level | Class V, EM |
| Die Sale Availability? | Yes |
| PROTO Availability? | Yes |
应用
- High frequency amplifiers and mixers
- High frequency converters
- Synchronous detector
| Part Number | Status | Samples | Stock | Package | Lead Count (#) | Carrier Type | Moisture Sensitivity Level (MSL) | DLA SMD | Pb (Lead) Free | Pb Free Category | MOQ | Temp. Range (°C) |
|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ISL73128RHF/PROTO | Active | Available | Out of Stock | CFP | 16# | Tray | Not Applicable | Exempt | Gold Plate over compliant Undercoat-e4 | 1 | -55 to +125°C | |
| ISL73128RHVF | Active | N/A | Out of Stock | CFP | 16# | Tray | Not Applicable | 5962F0721803VXC | Exempt | Gold Plate over compliant Undercoat-e4 | 25 | -55 to +125°C |
| ISL73128RHVX | Active | N/A | Out of Stock | DIE | 5962F0721803VXC | No | 100 | -40 to +105°C | ||||
| ISL73128RHX/SAMPLE | Active | N/A | Out of Stock | DIE | No | 5 | -40 to +125°C |
- 涨价通告英语PDF 360 KB PIN19011 2019年4月10日
- 产品咨询英语PDF 83 KB PA14004 2014年1月30日
- 产品咨询英语PDF 499 KB PA11003 2011年1月05日
- 产品变更通告英语PDF 230 KB PCN10123 2010年12月06日
- 应用说明英语PDF 256 KB an1503 2004年1月19日AI 生成的摘要: The document details the design of high-gain low-noise and wideband RF amplifiers using specific transistor arrays. It emphasizes minimizing conductor length in RF paths to maintain impedance and highlights component evaluation with network analyzers. The wideband amplifier achieves 10dB flat gain over 600MHz bandwidth with stable biasing using PNP transistors. The high-gain amplifier offers over 17dB gain at 900MHz with a 3.9dB noise figure. Microstrip board layouts and measured performance characteristics are provided.
- 应用说明英语PDF 338 KB an9867 1999年11月10日AI 生成的摘要: Electrical parameters are monitored during life testing to detect drift and failures, defined by exceeding datasheet limits. New products require less than 1% failure during burn-in, with failure analysis and corrective actions if exceeded. Sampling plans ensure defect rates below 3%. Life tests last 1000-3000 hours at 125°C depending on process maturity. Failure mechanisms include electromigration, ionic contamination, hot carrier injection, and dielectric rupture. Product sign-off requires all parties' approval after reliability confirmation. Space products undergo burn-in and quality conformance inspections with strict failure limits. Derating is unnecessary as datasheet limits are set at 6-sigma from characterization data, ensuring reliability.
- 数据手册英语PDF 469 KB isl73096rh-127rh-128rh-096eh-127eh-128eh 1999年7月27日
- 应用说明英语PDF 224 KB an9654 1999年5月05日AI 生成的摘要: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
- 数据手册英语PDF 469 KB isl73096rh-127rh-128rh-096eh-127eh-128eh 1999年7月27日
推荐文档 (1)
- 数据手册英语PDF 469 KB isl73096rh-127rh-128rh-096eh-127eh-128eh 1999年7月27日
数据手册 (1)
No Results Found.
确保所有关键词拼写正确。
尝试使用更少、不同或更宽泛的词语来改变搜索结果。
如果您使用了筛选器,请考虑取消选择某些筛选器选项以扩大搜索结果。
- 搜索我们丰富的知识库,帮助您解答常见问题
- 前往支持论坛,获取瑞萨电子技术专家和社群的帮助
- 应用说明英语PDF 256 KB an1503 2004年1月19日AI 生成的摘要: The document details the design of high-gain low-noise and wideband RF amplifiers using specific transistor arrays. It emphasizes minimizing conductor length in RF paths to maintain impedance and highlights component evaluation with network analyzers. The wideband amplifier achieves 10dB flat gain over 600MHz bandwidth with stable biasing using PNP transistors. The high-gain amplifier offers over 17dB gain at 900MHz with a 3.9dB noise figure. Microstrip board layouts and measured performance characteristics are provided.
- 应用说明英语PDF 338 KB an9867 1999年11月10日AI 生成的摘要: Electrical parameters are monitored during life testing to detect drift and failures, defined by exceeding datasheet limits. New products require less than 1% failure during burn-in, with failure analysis and corrective actions if exceeded. Sampling plans ensure defect rates below 3%. Life tests last 1000-3000 hours at 125°C depending on process maturity. Failure mechanisms include electromigration, ionic contamination, hot carrier injection, and dielectric rupture. Product sign-off requires all parties' approval after reliability confirmation. Space products undergo burn-in and quality conformance inspections with strict failure limits. Derating is unnecessary as datasheet limits are set at 6-sigma from characterization data, ensuring reliability.
- 应用说明英语PDF 224 KB an9654 1999年5月05日AI 生成的摘要: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
应用说明和白皮书 (3)
- 涨价通告英语PDF 360 KB PIN19011 2019年4月10日
- 产品咨询英语PDF 83 KB PA14004 2014年1月30日
- 产品咨询英语PDF 499 KB PA11003 2011年1月05日
- 产品变更通告英语PDF 230 KB PCN10123 2010年12月06日
产品通告(产品变更、EOL 等) (4)
No Results Found.
确保所有关键词拼写正确。
尝试使用更少、不同或更宽泛的词语来改变搜索结果。
如果您使用了筛选器,请考虑取消选择某些筛选器选项以扩大搜索结果。
- 搜索我们丰富的知识库,帮助您解答常见问题
- 前往支持论坛,获取瑞萨电子技术专家和社群的帮助
No Results Found.
确保所有关键词拼写正确。
尝试使用更少、不同或更宽泛的词语来改变搜索结果。
如果您使用了筛选器,请考虑取消选择某些筛选器选项以扩大搜索结果。
- 搜索我们丰富的知识库,帮助您解答常见问题
- 前往支持论坛,获取瑞萨电子技术专家和社群的帮助
No Results Found.
确保所有关键词拼写正确。
尝试使用更少、不同或更宽泛的词语来改变搜索结果。
如果您使用了筛选器,请考虑取消选择某些筛选器选项以扩大搜索结果。
- 搜索我们丰富的知识库,帮助您解答常见问题
- 前往支持论坛,获取瑞萨电子技术专家和社群的帮助
No Results Found.
确保所有关键词拼写正确。
尝试使用更少、不同或更宽泛的词语来改变搜索结果。
如果您使用了筛选器,请考虑取消选择某些筛选器选项以扩大搜索结果。
- 搜索我们丰富的知识库,帮助您解答常见问题
- 前往支持论坛,获取瑞萨电子技术专家和社群的帮助
No Results Found.
确保所有关键词拼写正确。
尝试使用更少、不同或更宽泛的词语来改变搜索结果。
如果您使用了筛选器,请考虑取消选择某些筛选器选项以扩大搜索结果。
- 搜索我们丰富的知识库,帮助您解答常见问题
- 前往支持论坛,获取瑞萨电子技术专家和社群的帮助
No Results Found.
确保所有关键词拼写正确。
尝试使用更少、不同或更宽泛的词语来改变搜索结果。
如果您使用了筛选器,请考虑取消选择某些筛选器选项以扩大搜索结果。
- 搜索我们丰富的知识库,帮助您解答常见问题
- 前往支持论坛,获取瑞萨电子技术专家和社群的帮助
营销资料 (1)
其他 (2)
No Results Found.
确保所有关键词拼写正确。
尝试使用更少、不同或更宽泛的词语来改变搜索结果。
如果您使用了筛选器,请考虑取消选择某些筛选器选项以扩大搜索结果。
- 搜索我们丰富的知识库,帮助您解答常见问题
- 前往支持论坛,获取瑞萨电子技术专家和社群的帮助