特性
- This Circuit is Processed in Accordance with MIL-STD- 883 and is Fully Conformant Under the Provisions of Paragraph 1.2.1.
- High Slew Rate 25V/µs (Min), 30V/µs (Typ)
- Wide Power Bandwidth 350kHz (Min)
- High Input Impedance 25MΩ (Min), 50MΩ (Typ)
- Low Offset Current 25nA (Max), 10nA (Typ)
- Low Quiescent Current 6mA (Max)
- Fast Settling Time (0.1% of 10V Step) 330ns (Typ)
- High Gain Bandwidth Product 12MHz (Typ)
- Internally Compensated For Unity Gain Stability
描述
The JM38510/12204BGA is the JAN version of the HA2-2500. HA-2500/883 is a monolithic operational amplifier that is optimized to deliver excellent slew rate, bandwidth, and settling time specifications. The outstanding dynamic features of this internally compensated device are complemented with low offset voltage and offset current. This dielectrically isolated amplifier is ideally suited for applications such as data acquisition, RF, video, and pulse conditioning circuits. Guaranteed slew rates of ±25V/µs minimum make it an excellent component in fast, accurate data acquisition and pulse amplification designs. To ensure compliance, all devices are 100% tested for AC performance characteristics over the full temperature limits. A typical 12MHz gain bandwidth product and 500kHz full power bandwidth make this device well suited to RF and video applications. With guaranteed offset voltages of 5mV plus external offset adjust flexibility and low offset current, this amplifier is particularly useful in signal conditioning designs.
产品参数
| 属性 | 值 |
|---|---|
| Rating | Harsh Environment |
| AVOL (dB) | 7.5 |
| Bandwidth (MHz) | 12 |
| Channels (#) | 1 |
| CMRR (dB) | 80 |
| IS per Amp (mA) | 4 |
| PSRR (db) | 80 |
| Rail-to-Rail Input/Output | No |
| Slew Rate (V/µs) | 25 |
| Supply Voltage (min) (V) | 10 - 10 |
| Supply Voltage (max) (V) | 20 - 20 |
| Temp. Range (°C) | -55 to +125°C |
| Flow | Harsh Environment & MIL-STD-883 |
| Qualification Level | Class Q |
| Die Sale Availability? | No |
| PROTO Availability? | No |
封装选项
| Pkg. Type | Pkg. Dimensions (mm) | Lead Count (#) | Pitch (mm) |
|---|---|---|---|
| CAN | 9.1 x 9.1 x 0.00 | 8 | 5.1 |
| Part Number | Status | Samples | Stock | Package | Lead Count (#) | Carrier Type | Moisture Sensitivity Level (MSL) | Pb (Lead) Free | Pb Free Category | MOQ | Temp. Range (°C) | CAGE code |
|---|---|---|---|---|---|---|---|---|---|---|---|---|
| JM38510/12204BGA | Active | Available | In Stock | CAN | 8# | Tray | Not Applicable | No | Hot Solder Dip | 60 | -55 to +125°C | 34371 |
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- 应用说明英语PDF 564 KB an1993 2018年5月22日AI 生成的摘要: Voltage feedback (VFB) amplifiers use a differential input pair, a high-impedance stage, and an output buffer to convert input voltage differences into output voltage. The VFB amplifier's gain decreases at a dominant pole frequency due to compensation capacitors. Current feedback (CFB) amplifiers include a class AB input amplifier, current mirror, high-impedance stage, and output buffer. CFB amplifiers provide faster switching and higher slew rates by drawing charge/discharge currents directly from supply rails, unlike VFB amplifiers which are limited by biasing current sources.
- 产品咨询英语PDF 499 KB PA11003 2011年1月05日
- 产品咨询英语PDF 67 KB PA10098 2010年10月21日
- 应用说明英语PDF 357 KB an1694 2004年1月19日AI 生成的摘要: The document outlines the four fundamental internal blocks of an operational amplifier and presents a simple 2:1 stage circuit diagram. It includes important legal notices from Renesas Electronics regarding the use, liability, and intellectual property rights of their semiconductor products. The document clarifies product quality grades, intended applications, and restrictions on use in life-critical or hazardous systems. It emphasizes compliance with applicable laws and safety responsibilities when using Renesas products. Contact information for Renesas sales offices worldwide is also provided.
- 应用说明英语PDF 843 KB an535 2002年6月05日AI 生成的摘要: A Data Acquisition System (DAS) requires careful design of signal conditioning, transducer selection, and signal transmission to ensure high accuracy. Signal conditioning includes multiplexing, amplification, filtering, and calibration, ideally performed near the transducer. Transducers convert physical variables to electrical signals, often voltage, with low source resistance preferred. Signal paths can be single-ended or differential; differential paths better reject common mode noise, especially for low-level signals. Shielded twisted pairs and balanced lines reduce interference. Filters, typically Butterworth low-pass, prevent aliasing and maintain signal integrity.
- 应用说明英语PDF 338 KB an9867 1999年11月10日AI 生成的摘要: Electrical parameters are monitored during life testing to detect drift and failures, defined by exceeding datasheet limits. New products require less than 1% failure during burn-in, with failure analysis and corrective actions if exceeded. Sampling plans ensure defect rates below 3%. Life tests last 1000-3000 hours at 125°C depending on process maturity. Failure mechanisms include electromigration, ionic contamination, hot carrier injection, and dielectric rupture. Product sign-off requires all parties' approval after reliability confirmation. Space products undergo burn-in and quality conformance inspections with strict failure limits. Derating is unnecessary as datasheet limits are set at 6-sigma from characterization data, ensuring reliability.
- 应用说明英语PDF 224 KB an9654 1999年5月05日AI 生成的摘要: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
- 其他英语Standard Microcircuit Drawing MIL-M-38510/122C (HA-2500/883, HA-2510/883, HA-2520, HA-2600, HA-2620)RECOMMENDED2018年8月28日
- 其他英语Standard Microcircuit Drawing MIL-M-38510/122C (HA-2500/883, HA-2510/883, HA-2520, HA-2600, HA-2620)RECOMMENDED2018年8月28日
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- 应用说明英语PDF 564 KB an1993 2018年5月22日AI 生成的摘要: Voltage feedback (VFB) amplifiers use a differential input pair, a high-impedance stage, and an output buffer to convert input voltage differences into output voltage. The VFB amplifier's gain decreases at a dominant pole frequency due to compensation capacitors. Current feedback (CFB) amplifiers include a class AB input amplifier, current mirror, high-impedance stage, and output buffer. CFB amplifiers provide faster switching and higher slew rates by drawing charge/discharge currents directly from supply rails, unlike VFB amplifiers which are limited by biasing current sources.
- 应用说明英语PDF 357 KB an1694 2004年1月19日AI 生成的摘要: The document outlines the four fundamental internal blocks of an operational amplifier and presents a simple 2:1 stage circuit diagram. It includes important legal notices from Renesas Electronics regarding the use, liability, and intellectual property rights of their semiconductor products. The document clarifies product quality grades, intended applications, and restrictions on use in life-critical or hazardous systems. It emphasizes compliance with applicable laws and safety responsibilities when using Renesas products. Contact information for Renesas sales offices worldwide is also provided.
- 应用说明英语PDF 843 KB an535 2002年6月05日AI 生成的摘要: A Data Acquisition System (DAS) requires careful design of signal conditioning, transducer selection, and signal transmission to ensure high accuracy. Signal conditioning includes multiplexing, amplification, filtering, and calibration, ideally performed near the transducer. Transducers convert physical variables to electrical signals, often voltage, with low source resistance preferred. Signal paths can be single-ended or differential; differential paths better reject common mode noise, especially for low-level signals. Shielded twisted pairs and balanced lines reduce interference. Filters, typically Butterworth low-pass, prevent aliasing and maintain signal integrity.
- 应用说明英语PDF 338 KB an9867 1999年11月10日AI 生成的摘要: Electrical parameters are monitored during life testing to detect drift and failures, defined by exceeding datasheet limits. New products require less than 1% failure during burn-in, with failure analysis and corrective actions if exceeded. Sampling plans ensure defect rates below 3%. Life tests last 1000-3000 hours at 125°C depending on process maturity. Failure mechanisms include electromigration, ionic contamination, hot carrier injection, and dielectric rupture. Product sign-off requires all parties' approval after reliability confirmation. Space products undergo burn-in and quality conformance inspections with strict failure limits. Derating is unnecessary as datasheet limits are set at 6-sigma from characterization data, ensuring reliability.
- 应用说明英语PDF 224 KB an9654 1999年5月05日AI 生成的摘要: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
应用说明和白皮书 (5)
- 产品咨询英语PDF 499 KB PA11003 2011年1月05日
- 产品咨询英语PDF 67 KB PA10098 2010年10月21日
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- 其他英语Standard Microcircuit Drawing MIL-M-38510/122C (HA-2500/883, HA-2510/883, HA-2520, HA-2600, HA-2620)RECOMMENDED2018年8月28日
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