Evaluation Board for ISL73007SEH (12VIN to 3.3V-1.2V output)
The ISL73007SEHEV2Z evaluation board features the ISL73007SEH buck regulator. The IC is a small footprint radiation hardened POL designed for critical low power...
概览
描述
The ISL73007SEH is a radiation hardened Point-of-Load (POL) buck regulator that provides up to 3A of output current capability with an input voltage ranging from 3V to 18V. The device uses constant frequency peak current mode control architecture for fast loop transient response. The device uses internal compensation or an external Type II compensation to optimize performance and stabilize the loop. The ISL73007SEH has an internally configured switching frequency of 500kHz. The ISL73007SEH switching frequency can be adjusted from 300kHz to 1MHz using an external resistor.
The ISL73007SEH integrates high-side (P-Channel) and low-side (N-Channel) power FETs. There are options for external or internal compensation, switching frequency, and slope control, that can be implemented with a minimum of external components reducing the BOM count and design complexity.
The ISL73007SEH includes a comprehensive suite of operational features and protections, including preset undervoltage, overvoltage, and overcurrent protections, power-good, soft-start, and over-temperature.
The ISL73007SEH is designed to operate across the temperature range of -55 °C to +125 °C and is available in a 14-lead ceramic dual in-line flat package (CDFP) and die form.
特性
- Input bias voltage (3V to 18V)
- Internal or external loop compensation
- 1% reference voltage over-temperature and radiation
- Switching frequency dependent soft-start
- Positive and negative overcurrent, over/undervoltage, and over-temperature protections
- High 500kHz efficiency ≥90% from 1A to 3A
- 300kHz to 1MHz adjustable switching frequency
- Adjustable slope compensation
- Qualified to Renesas Rad Hard QML-V equivalent screening and QCI Flow (R34TB0001EU)
- All screening and QCI is in accordance with MIL-PRF-38535 Class-V
- Radiation acceptance testing
- LDR (0.01rad(Si)/s): 75krad(Si)
- SEE Hardness
- Single Event Burnout (SEB) to LET of 86 MeV•cm2/mg
产品对比
应用
- Low power auxiliary rails for FPGAs, DSPs, CPUs, and ASICs
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| 类型 | 文档标题 | 日期 |
| 数据手册 | PDF 1.25 MB | |
| 产品咨询 | PDF 594 KB | |
| 技术摘要 | PDF 340 KB | |
| 报告 | PDF 1.60 MB | |
| 报告 | PDF 632 KB | |
| 应用笔记 | PDF 224 KB | |
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设计和开发
软件与工具
开发板与套件
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