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家电功能安全解决方案Class-B

瑞萨电子提供了支持IEC60730 B类认证的相关应用文档和样例程序,帮助客户获得终端产品的功能安全的认证。

本解决方案涵盖了RL78 系列、RX100/200/600 系列和 RA2/RA4/RA6 系列等瑞萨电子的各系列微控制器。

IEC60730 Class-B要求的微控制器诊断位置

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Location of Microcontroller Diagnostics Required by IEC 60730 Class B

 

RA&RL 的 IEC60730/60335 的合规状况

Standard Number and SectionLocation of MCU DiagnosticsError or Abnormality That Should be InspectedLocation No.Supported MCU Series
RL78RA2/RA4/RA6Synergy S5D9
1. CPU1.1 RegistersCPU RegistersStuckSupport via softwareSupport via softwareSupport via software
1.3 Program counterCPU Program CounterStuckSupport via IWDTSupport via IWDTSupport via IWDT
2. Interrupt handling and execution Interrupt unitNo interrupt or too frequent interruptSupport via softwareSupport via softwareSupport via software
3. Clock ClockFailure or Wrong frequencySupport via TAU channel 0 or Channel 5Support via CACSupport via CAC
4. Memory4.1 Invariable memoryROM/FlashAll single-bit faultSupport via general/high-speed CRCSupport via general CRCSupport via general CRC
4.2 Variable memoryRAMDC faultSupport via softwareSupport via softwareSupport via software
6. External Communication6.1 DataCommunication portFailure or not accurateSupport via general CRCSupport via general CRCSupport via general CRC
7. Input/output periphery7.1 Digital I/OInput/Output PortStuck or not accurateSupport via pin state read function when setting outputSupport via independent input register and output registerSupport via independent input register and output register
7.2 Analog I/OAnalog CircuitFailure or not accurateSupport via AD test functionSupport via AD test functionSupport via AD test function

RX 的 IEC60730/60335 的合规状况

Standard Number and SectionLocation of MCU DiagnosticsError or Abnormality That Should be InspectedLocation No.Supported MCU Series
RX100 / RX200 / RX600
1. CPU1.1 RegistersCPU RegistersStuck atSupport via software
1.3 Program counterCPU Program CounterStuck atSupport via IWDT
2. Interrupt handling and executionInterrupt unitNo interrupt or too frequent interrupt-- (Not supported)
3. ClockClockFailure or Wrong frequencySupport via CAC
4. Memory4.1 Invariable memoryROMAll single-bit faultSupport via software & CRC (Not supported for Data Flash)
4.2 Variable memoryRAMDC faultSupport via software
4.3 AddressingROM/RAMStuck at④⑤Support via software
5. Internal data path5.1 DataROM/RAMStuck at④⑤Support via software
5.2 AddressingROM/RAMWrong address④⑤Support via software
6. External Communication6.1 DataCommunication portFailure or not accurate- (Not supported)
7. Input/output periphery7.1 Digital I/OInput/Output PortStuck or not accurate- (Not supported)
7.2 Analog I/OAnalog CircuitFailure or not accurateSupport via AD test function
微处理器应用文档样例程序集成开发环境/编译器认证书
RL78/GxxIEC60730/60335 Self Test Library of CCRL78 for RL78 MCU Application Notes (R01AN4822EJ0210) (PDF | English, 日本語)IEC60730/60335 Self Test Library of CCRL78 for RL78 MCU Application Notes (r01an4822ej0210) - Sample Code (ZIP | English, 日本語)CS+/CC-RLRL78 CCRL78 VDE Certification (PDF)2
RL78/GxxIEC60730/60335 Self Test Library of CARL78 for RL78 MCU extended Application Notes Rev.1.20 (PDF | English, 日本語)IEC60730/60335 Self Test Library of CARL78 for RL78 MCU extended Application Notes - Sample Code (ZIP | English, 日本語)CS+/ CA78K0RRL78 ROM512K VDE Certification (PDF)
RL78/Gxx4IEC60730/60335 Self Test Library of CCRL78 for RL78 MCU extended Application Notes (R01AN4819EJ0110) Rev.1.10 (PDF | English, 日本語)
RL78 Family MCU Diff Guide for Using the IEC60730/60335 Self Test Library Rev.1.00 (PDF | English, 日本語)
IEC60730/60335 Self Test Library of CCRL78 for RL78 MCU extended Application Notes - Sample Code (r01an4819ej0110) (ZIP | English, 日本語)CS+/CC-RLRL78 ROM512K VDE Certification (PDF)3
RX (RX130, RX13T, RX140, RX231, RX230, RX23T, RX24T, RX26T, RX23E-B, RX65N, RX651, RX66T, RX660, RX671)软件包中包含示例代码。请参阅 IEC60730 B 级标准的 RX 系列自检软件套件。IEC60730 Class B-Compliant RX Family Self Test Software Kit (ZIP | English, 日本語)CC-RX认证编号 968/FSP 2650.00/245
RA2 (RA2L1, RA2E1, RA2E2, RA2E3, RA2A1)
RA4 (RA4M1, RA4W1)
RA6 (RA6M1, RA6M2, RA6M3, RA6T1)
RA Family IEC 60730/60335 Self Test Library for RA MCU (CM4_CM23) (PDF | English, 日本語)RA Family IEC 60730/60335 Self Test Library for RA MCU (CM4_CM23) - Sample Code (ZIP | English, 日本語) *For e2 studioe2studio/GCCRA2, RA4, RA6 VDE Certification (PDF)
RA2 (RA2L1, RA2E1, RA2E2, RA2E3, RA2A1)
RA4 (RA4M1, RA4W1)
RA6 (RA6M1, RA6M2, RA6M3, RA6T1)
RA Family IEC 60730/60335 Self Test Library for RA MCU (CM4_CM23) (PDF | English, 日本語)RA Family IEC 60730/60335 Self Test Library for RA MCU (CM4_CM23) - Sample Code (ZIP | English, 日本語) * For EWARMEWARM/IARRA2, RA4, RA6 VDE Certification (PDF)
RA4 (RA4M2, RA4M3, RA4E1, RA4E2, RA4T1)RA Family IEC 60730/60335 Self Test Library for RA MCU (RA4_CM33) (PDF | English, 日本語)RA Family IEC 60730/60335 Self Test Library for RA MCU (RA4_CM33) - Sample Code (ZIP | English, 日本語) *e2 studio版e2studio/GCCRA2, RA4, RA6 VDE Certification (PDF)
RA4 (RA4M2, RA4M3, RA4E1, RA4E2, RA4T1)RA Family IEC 60730/60335 Self Test Library for RA MCU (RA4_CM33) (PDF | English, 日本語)RA Family IEC 60730/60335 Self Test Library for RA MCU (RA4_CM33) - Sample Code (ZIP | English, 日本語) *EWARM版EWARM/IARRA2, RA4, RA6 VDE Certification (PDF)
RA6 (RA6M4, RA6M5, RA6E1, RA6E2, RA6T3)RA Family IEC 60730/60335 Self Test Library for RA MCU (RA4_CM33) (PDF | English, 日本語)RA Family IEC 60730/60335 Self Test Library for RA MCU (RA4_CM33) - Sample Code (ZIP | English, 日本語) *For e2 studioe2studio/GCCRA2, RA4, RA6 VDE Certification (PDF)
RA6 (RA6M4, RA6M5, RA6E1, RA6E2, RA6T3)RA Family IEC 60730/60335 Self Test Library for RA MCU (RA4_CM33) (PDF | English, 日本語)RA Family IEC 60730/60335 Self Test Library for RA MCU (RA4_CM33) - Sample Code (ZIP | English, 日本語) * For EWARMEWARM/IARRA2, RA4, RA6 VDE Certification (PDF)
RA6T2 (Arm® Cortex®-M33)RA Family IEC 60730/60335 Self Test Library for RA6T2 MCU (CM33) Application Notes (PDF | English, 日本語)RA Family IEC 60730/60335 Self Test Library for RA6T2 MCU (CM33) Rev.1.00 - Sample Code (ZIP | English, 日本語) * For e2studioe2studio/GCCRA2, RA4, RA6 VDE Certification (PDF)
S5D9请参阅S5D9 IEC 60730 自检库 EWARM/IARVDE Certificate for IEC60730 Self-test Library

UL60730是北美指定的功能安全标准。Class-B相关信息,可使用下方网址,输入UL No. 并进行搜索。
http://database.ul.com/cgi-bin/XYV/template/LISEXT/1FRAME/index.html

MCU FamilySeriesUL No.
RL78G12, G13, G14E359023
RXRX110, RX111, RX113, RX130
RX210, RX21A, RX220, RX230, RX231, RX23T, RX24T
E359023
RARA2L1, RA2E1, RA2E2, RA2E3, RA2A1
RA4M1, RA4M2, RA4M3, RA4E1, RA4E2, RA4W1
RA6M1, RA6M2, RA6M3, RA6E1, RA6E2, RA6M4, RA6M5
RA6T1, RA6T2
E537266

1. IEC60730/60335由VDE进行认证。

2. 此项为旧版本的自检测库。
瑞萨电子已从VDE取得此旧版本的功能安全认证,但此项相关的应用文档和样例程序仅供继续使用旧版本自检测库的客户。

3. 供新客户使用的自检测库的相关应用文档和样例程序。

4. 可访问RL78/G23产品页 获取RL78/G23功能安全相关的外围设备的应用文档。

5. 您可以在德国莱茵 TÜV 的认证数据库网站上查看认证信息。