特性
- This Circuit is Processed in Accordance to MIL-STD-883 and is Fully Conformant Under the Provisions of Paragraph 1.2.1.
- Wide Analog Signal Range . . . . . . . . . . . . . . . . . . ±15V
- Low "ON" Resistance . . . . . . . . . . .25Ω (Typ), 50Ω (Max)
- High Current Capability . . . . . . . . . . . . . . . . 70mA (Max)
- Break-Before-Make Switching
- Turn-On Time. . . . . . . . . . . . .370ns (Typ), 800ns (Max)
- Turn-Off Time . . . . . . . . . . . . 280ns (Typ), 400ns (Max)
- No Latch-Up
- Input MOS Gates are Protected from Electrostatic Discharge
- DTL, TTL, CMOS, PMOS Compatible
描述
This CMOS analog switch offers low resistance switching performance for analog voltages up to the supply rails and for signal currents up to 70mA. “ON” resistance is low and stays reasonably constant over the full range of operating signal voltage and current. RON remains exceptionally constant for input voltages between +5V and -5V and currents up to 50mA. Switch impedance also changes very little over temperature, particularly between 0°C and +75°C. RON is nominally 25Ω. The HI-5051/883 provides break-before-make switching and is TTL and CMOS compatible for maximum application versatility. Performance is further enhanced by Dielectric Isolation processing which insures latch-free operation with very low input and output leakage currents (0. 8nA at +25°C). The HI-5051/883 switch also features very low power operation (1. 5mW at +25°C). The HI-5051/883 is available in a 20 Ld CLCC package and operates over the -55°C to +125°C temperature range.
产品参数
| 属性 | 值 |
|---|---|
| Rating | MIL-STD-883 |
| Switches (#) | 2 |
| RON (max) (ohms) | 25 |
| Supply Voltage (min) (V) | -15 - -15 |
| Supply Voltage (max) (V) | 15 - 15 |
| Turn-Off Time (max) (ns) | 500 |
| Turn-On Time (max) (ns) | 500 |
| Temp. Range (°C) | -55 to +125°C |
| Flow | Harsh Environment & MIL-STD-883 |
| Qualification Level | Class Q |
| Die Sale Availability? | No |
封装选项
| Pkg. Type | Pkg. Dimensions (mm) | Lead Count (#) | Pitch (mm) |
|---|---|---|---|
| CLCC | 8.9 x 8.9 x 0.00 | 20 | 1.3 |
应用
- High Frequency Switching
- Sample and Hold
- Digital Filters
- Operational Amplifier Gain Switching
| Part Number | Status | Samples | Stock | Package | Lead Count (#) | Carrier Type | Moisture Sensitivity Level (MSL) | Pb (Lead) Free | Pb Free Category | MOQ | Temp. Range (°C) | CAGE code |
|---|---|---|---|---|---|---|---|---|---|---|---|---|
| HI4-5051/883 | Active | Available | In Stock | CLCC | 20# | Tube | Not Applicable | No | Hot Solder Dip | 112 | -55 to +125°C | 34371 |
| 81006222A | Obsolete | N/A | In Stock | CLCC | 20# | Tube | Not Applicable | No | Hot Solder Dip | 112 | -55 to +125°C | 34371 |
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- 产品变更通告英语PDF 260 KB PCN16087 2016年9月30日
- EOL 通告英语PDF 200 KB PLC15033 2015年6月11日
- 产品变更通告英语PDF 174 KB PCN14017 2014年4月21日
- 应用说明英语PDF 468 KB an557 2002年5月24日AI 生成的摘要: The document details recommended test procedures for analog switches, focusing on key parameters such as crosstalk, break-before-make delay, and settling time. It explains how to measure crosstalk using decibel ratios and outlines the importance of break-before-make delay to prevent simultaneous switch closure. Settling time is measured to ensure output stability after input changes. It also covers input thresholds, leakage currents, power dissipation, and various switch capacitances, providing test circuit examples and conditions for accurate measurement.
- 应用说明英语PDF 224 KB an9654 1999年5月05日AI 生成的摘要: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
- 应用说明英语PDF 300 KB an1034 1998年11月20日AI 生成的摘要: The document discusses the use of analog switches and multiplexers in wideband applications, highlighting the HI-524 monolithic wideband CMOS multiplexer and the HA-2541 amplifier. It emphasizes the importance of unity gain stability, fast settling time, and output swing for driving coaxial cables. The HI-524 includes feedback resistance to minimize offset voltage. Proper layout is crucial to avoid feedthrough and excessive capacitance. The document also outlines Renesas Electronics' disclaimers on product use, quality grades, safety responsibilities, environmental compliance, and legal restrictions.
- 应用说明英语PDF 302 KB an1033 1998年11月20日AI 生成的摘要: A CMOS multiplexer (MUX) can function as a demultiplexer by using synchronized address lines and capacitors to hold output signals between samples. However, overvoltage protection requires an external network. More precise demultiplexing uses sample-and-hold circuits like the HA-2420/2425 for each channel. The document also includes detailed disclaimers about product use, liability, quality grades, safety responsibilities, and regulatory compliance for Renesas Electronics products.
- 应用说明英语PDF 270 KB an520 1998年11月20日AI 生成的摘要: Adding a pull-up resistor from CMOS inputs to +5V is essential when interfacing TTL outputs with CMOS inputs to improve interchangeability, noise immunity, compatibility, and reliability. A 2kΩ resistor is generally sufficient. CMOS inputs are compatible with CMOS logic at 5V to 15V without pull-ups. Mechanical switches require pull-up or pull-down resistors to prevent noise and contact issues. Renesas disclaims liability for misuse and emphasizes adherence to product specifications and legal regulations.
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- 应用说明英语PDF 468 KB an557 2002年5月24日AI 生成的摘要: The document details recommended test procedures for analog switches, focusing on key parameters such as crosstalk, break-before-make delay, and settling time. It explains how to measure crosstalk using decibel ratios and outlines the importance of break-before-make delay to prevent simultaneous switch closure. Settling time is measured to ensure output stability after input changes. It also covers input thresholds, leakage currents, power dissipation, and various switch capacitances, providing test circuit examples and conditions for accurate measurement.
- 应用说明英语PDF 224 KB an9654 1999年5月05日AI 生成的摘要: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
- 应用说明英语PDF 300 KB an1034 1998年11月20日AI 生成的摘要: The document discusses the use of analog switches and multiplexers in wideband applications, highlighting the HI-524 monolithic wideband CMOS multiplexer and the HA-2541 amplifier. It emphasizes the importance of unity gain stability, fast settling time, and output swing for driving coaxial cables. The HI-524 includes feedback resistance to minimize offset voltage. Proper layout is crucial to avoid feedthrough and excessive capacitance. The document also outlines Renesas Electronics' disclaimers on product use, quality grades, safety responsibilities, environmental compliance, and legal restrictions.
- 应用说明英语PDF 302 KB an1033 1998年11月20日AI 生成的摘要: A CMOS multiplexer (MUX) can function as a demultiplexer by using synchronized address lines and capacitors to hold output signals between samples. However, overvoltage protection requires an external network. More precise demultiplexing uses sample-and-hold circuits like the HA-2420/2425 for each channel. The document also includes detailed disclaimers about product use, liability, quality grades, safety responsibilities, and regulatory compliance for Renesas Electronics products.
应用说明和白皮书 (6)
- 产品变更通告英语PDF 260 KB PCN16087 2016年9月30日
- EOL 通告英语PDF 200 KB PLC15033 2015年6月11日
- 产品变更通告英语PDF 174 KB PCN14017 2014年4月21日
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