特性
- DLA SMD 5962-11212
- Output current up to 3.0A at TJ = +150°C
- Output accuracy ±1.5% over MIL temperature range
- Ultra low dropout:
- 65mV (typical) dropout at 1.0A
- 225mV (typical) dropout at 3.0A
- SET mitigation with no added filtering/diodes
- Input supply range: 2.2V to 6.0V
- Fast load transient response
- Shutdown current of 1μA (typical)
- Output adjustable using external resistors
- PSRR 66dB (typical) at 1kHz
- Enable and PGood feature
- Programmable soft-start/inrush current limiting
- Over-temperature shutdown and programmable OCP limits
- Stable with 47μF min tantalum capacitor
- Radiation environment
- High dose rate (50-300rad(Si)/s): 100krad(Si)
- Low dose rate (0.01rad(Si)/s): 100krad(Si)*
*Product capability established by initial characterization. The "EH" version is acceptance tested on a wafer-by-wafer basis to 50 krad(Si) at low dose rate.
描述
Support is limited to customers who have already adopted these products.
The ISL75051SEH, ISL75051SRH are radiation hardened low-voltage, high-current, single-output LDOs specified for up to 3. 0A of continuous output current. These devices operate over an input voltage range of 2. 2V to 6. 0V and are capable of providing output voltages of 0. 8V to 5. 0V adjustable, based on resistor divider setting. Dropout voltages as low as 65mV can be realized using the device. The OCP pin allows the short-circuit output current limit threshold to be programmed by means of a resistor from the OCP pin to GND. The OCP setting range is from 0. 5A minimum to 8. 5A maximum. The resistor sets the constant current threshold for the output under fault conditions. The thermal shutdown disables the output if the device temperature exceeds the specified value. It subsequently enters an ON/OFF cycle until the fault is removed. The ENABLE feature allows the part to be placed into a low current shutdown mode that typically draws about 1μA. These devices are optimized for fast transient response and single event effects. This reduces the magnitude of SET seen on the output. Additional protection diodes and filters are not needed. These devices are stable with tantalum capacitors as low as 47μF and provide excellent regulation all the way from no load to full load. Programmable soft-start allows the user to program the inrush current by means of the decoupling capacitor value used on the BYP pin.
应用
- LDO Regulator for Space Application
- DSP, FPGA and µP Core Power Supplies
- Post-regulation of Switched Mode Power Supplies
- Down-hole Drilling
| Part Number | Status | Samples | Stock | Package | Lead Count (#) | Carrier Type | DLA SMD | Pb (Lead) Free | MOQ | Temp. Range (°C) |
|---|---|---|---|---|---|---|---|---|---|---|
| ISL75051SRHF/PROTO | Obsolete | N/A | Out of Stock | CFP | 18# | Tray | No | 1 | -55 to +125°C | |
| ISL75051SRHQF | Obsolete | N/A | Out of Stock | CFP | 18# | Tray | 5962-11212 | No | 15 | -55 to +125°C |
| ISL75051SRHVF | Obsolete | N/A | Out of Stock | CFP | 18# | Tray | 5962-11212 | No | 15 | -55 to +125°C |
- 报告英语PDF 340 KB TR043 2026年5月28日
- PCB 设计文件英语PDF 98 KB virtex5mezpwrev1z_reva_schematics 2017年11月17日
- PCB 设计文件英语ZIP 328 KB virtex5mezpwrev1z_reva_artwork 2017年11月17日
- 产品警报通告英语PDF 235 KB PAN17022 2017年5月26日
- 模型 - SPICE英语
- 报告英语PDF 325 KB isl75051srh_tid_report_2col_100k_jul2012 2012年8月16日
- 应用说明英语PDF 304 KB an1947 2009年1月05日AI 生成的摘要: The document outlines important legal disclaimers and usage guidelines for semiconductor products. It emphasizes user responsibility for product design and safety, disclaims liability for damages from improper use, and restricts unauthorized modifications. Products are categorized into Standard and High Quality grades with specific application scopes. Users must comply with laws, regulations, and safety measures, especially for high-risk applications. Contact information for Renesas Electronics sales offices worldwide is provided.
- 应用说明英语PDF 224 KB an9654 1999年5月05日AI 生成的摘要: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
推荐文档 (1)
数据手册 (1)
手册和指南 (2)
- 应用说明英语PDF 304 KB an1947 2009年1月05日AI 生成的摘要: The document outlines important legal disclaimers and usage guidelines for semiconductor products. It emphasizes user responsibility for product design and safety, disclaims liability for damages from improper use, and restricts unauthorized modifications. Products are categorized into Standard and High Quality grades with specific application scopes. Users must comply with laws, regulations, and safety measures, especially for high-risk applications. Contact information for Renesas Electronics sales offices worldwide is provided.
- 应用说明英语PDF 224 KB an9654 1999年5月05日AI 生成的摘要: The document explains the reliability and failure mechanisms of semiconductor parts, focusing on life testing and wearout. It discusses how switching states cause transient current pulses and hot carrier injection, which only occur briefly during switching. Life testing at elevated temperatures accelerates aging to remove infant mortality failures, improving reliability. The failure rate follows a bathtub curve with infant mortality, useful life, and wearout phases, modeled by lognormal and exponential distributions. The Arrhenius equation relates failure rates at different temperatures. Burn-in and life tests reduce early failures without harming intrinsic reliability.
应用说明和白皮书 (2)
- 产品警报通告英语PDF 235 KB PAN17022 2017年5月26日
产品通告(产品变更、EOL 等) (2)
No Results Found.
确保所有关键词拼写正确。
尝试使用更少、不同或更宽泛的词语来改变搜索结果。
如果您使用了筛选器,请考虑取消选择某些筛选器选项以扩大搜索结果。
- 搜索我们丰富的知识库,帮助您解答常见问题
- 前往支持论坛,获取瑞萨电子技术专家和社群的帮助
No Results Found.
确保所有关键词拼写正确。
尝试使用更少、不同或更宽泛的词语来改变搜索结果。
如果您使用了筛选器,请考虑取消选择某些筛选器选项以扩大搜索结果。
- 搜索我们丰富的知识库,帮助您解答常见问题
- 前往支持论坛,获取瑞萨电子技术专家和社群的帮助
- PCB 设计文件英语PDF 98 KB virtex5mezpwrev1z_reva_schematics 2017年11月17日
- PCB 设计文件英语ZIP 328 KB virtex5mezpwrev1z_reva_artwork 2017年11月17日
原理图和设计文件 (4)
No Results Found.
确保所有关键词拼写正确。
尝试使用更少、不同或更宽泛的词语来改变搜索结果。
如果您使用了筛选器,请考虑取消选择某些筛选器选项以扩大搜索结果。
- 搜索我们丰富的知识库,帮助您解答常见问题
- 前往支持论坛,获取瑞萨电子技术专家和社群的帮助
No Results Found.
确保所有关键词拼写正确。
尝试使用更少、不同或更宽泛的词语来改变搜索结果。
如果您使用了筛选器,请考虑取消选择某些筛选器选项以扩大搜索结果。
- 搜索我们丰富的知识库,帮助您解答常见问题
- 前往支持论坛,获取瑞萨电子技术专家和社群的帮助
No Results Found.
确保所有关键词拼写正确。
尝试使用更少、不同或更宽泛的词语来改变搜索结果。
如果您使用了筛选器,请考虑取消选择某些筛选器选项以扩大搜索结果。
- 搜索我们丰富的知识库,帮助您解答常见问题
- 前往支持论坛,获取瑞萨电子技术专家和社群的帮助
营销资料 (1)
- 报告英语PDF 340 KB TR043 2026年5月28日
- 报告英语PDF 325 KB isl75051srh_tid_report_2col_100k_jul2012 2012年8月16日
其他 (5)
No Results Found.
确保所有关键词拼写正确。
尝试使用更少、不同或更宽泛的词语来改变搜索结果。
如果您使用了筛选器,请考虑取消选择某些筛选器选项以扩大搜索结果。
- 搜索我们丰富的知识库,帮助您解答常见问题
- 前往支持论坛,获取瑞萨电子技术专家和社群的帮助
筛选
当前筛选条件
软件与工具
按类型筛选
按供应商筛选
样例程序
按应用筛选
按功能筛选
按编译器筛选
按 IDE 筛选
模拟模型
Partner Solutions
- PCB 设计文件英语ZIP 328 KB virtex5mezpwrev1z_reva_artwork 2017年11月17日
- PCB 设计文件英语PDF 98 KB virtex5mezpwrev1z_reva_schematics 2017年11月17日
- 模型 - SPICE英语
No Results Found.
确保所有关键词拼写正确。
尝试使用更少、不同或更宽泛的词语来改变搜索结果。
如果您使用了筛选器,请考虑取消选择某些筛选器选项以扩大搜索结果。
- 搜索我们丰富的知识库,帮助您解答常见问题
- 前往支持论坛,获取瑞萨电子技术专家和社群的帮助
- PCB 设计文件英语ZIP 328 KB virtex5mezpwrev1z_reva_artwork 2017年11月17日
- PCB 设计文件英语PDF 98 KB virtex5mezpwrev1z_reva_schematics 2017年11月17日
软件与工具 (4)
No Results Found.
确保所有关键词拼写正确。
尝试使用更少、不同或更宽泛的词语来改变搜索结果。
如果您使用了筛选器,请考虑取消选择某些筛选器选项以扩大搜索结果。
- 搜索我们丰富的知识库,帮助您解答常见问题
- 前往支持论坛,获取瑞萨电子技术专家和社群的帮助
- 模型 - SPICE英语
模拟模型 (1)
No Results Found.
确保所有关键词拼写正确。
尝试使用更少、不同或更宽泛的词语来改变搜索结果。
如果您使用了筛选器,请考虑取消选择某些筛选器选项以扩大搜索结果。
- 搜索我们丰富的知识库,帮助您解答常见问题
- 前往支持论坛,获取瑞萨电子技术专家和社群的帮助
Rad Hard Virtex 5 FPGA Power Solution Reference Design
Renesas offers a complete solution for powering radiation hardened FPGAs. Many space-grade FPGAs require a core voltage of 1.0V, which is supplied by the ISL70002SEH, an auxiliary voltage of 2.5V, which is supplied by the ISL70001SEH, and an I/O voltage of 3.3V, which is supplied by the 阅读详情